Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/10868
標題: 以磁控濺鍍法於低真空下製備Al及AlN薄膜之研究
Low-vacuum preparation of Al and AlN thin films by magnetron sputtering
作者: 姚力仁
Yao, Li-Ren
關鍵字: magnetron sputtering
磁控濺鍍法
出版社: 材料科學與工程學系所
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摘要: 過去文獻中利用磁控濺鍍法製備Al與AlN薄膜,皆以高純度Al靶進行鍍著,並將腔體內的真空度抽至高真空,以減少殘留氣體的影響,才進行鍍膜,由於在腔體抽氣至高真空,必須耗費較長的時間及較多的成本,如何節省成本以提高自我競爭力,已變成重要的議題。本研究利用磁控濺鍍法,縮短抽真空的時間,並於低真空下 (1.3×10-2 Pa,抽氣時間約三分鐘),通入氬氣製備Al薄膜及通入氮氣/氬氣之混合氣體製備AlN薄膜,成功製備出性質與高真空(6.6×10-4 Pa,抽氣時間至少要30分鐘)下所製備性質相近的薄膜,不僅可以達到節省抽氣至高真空所耗的能源,此外可大幅減少抽氣時間以達到節能減碳的目的。 在背景壓力為低真空下製備Al薄膜,本研究控制純氬氣流量為15 sccm、鍍著功率200 W、鍍著時間10分鐘、基板偏壓-50 V,工作壓力0.16 Pa下鍍著之薄膜,在背景壓力為低真空下製備AlN薄膜,控制氮氣/氬氣流量比為(26~40)/100、鍍著功率300 W、鍍著時間20分鐘、工作壓力0.253~0.263 Pa下鍍著之薄膜,並以高真空(6.6×10-4 Pa)為對照組,經由X光繞射儀(XRD)進行薄膜之結晶相分析,以場發射電子顯微鏡(FE-SEM)進行薄膜之橫截面分析,以穿透式電子顯微鏡(HR-TEM)觀察薄膜之顯微結構,以X光電子能譜儀(XPS)與電子微探儀(FE-EPMA)進行成分分析,以四點探針,以奈米硬度儀量測薄膜硬度及楊氏模數,以雷射曲率法量測薄膜中的殘留應力,綜合各項儀器分析結果歸納Al與AlN薄膜的特性,在低真空下,通入純氬氣所製備之Al薄膜,晶體結構為FCC結構,薄膜成分O的原子百分比約為6.2 at.%,且不含N的成分,硬度為3.2±0.5 GPa,電阻率為4±0.9 μΩ-cm,方均根粗糙度約為6.4±0.4 nm,而在低真空下,通入氮氣/氬氣流量比值為(26~40)/100下,所製備之AlN薄膜,晶體結構為六方晶系的纖鋅礦結構,薄膜中Al的原子百分比分別約為34~41.9 at.%、N的原子百分比分別約為54~58.1 at.%、O的原子百分比分別約為3.2~12 at.%,硬度約為(17±0.7)~(25±0.6) GPa,方均根粗糙度約為(0.6±0.4)~(1.1±0.8) nm,本研究發現在低真空下所製備之Al和AlN薄膜與高真空相比性質相近,由於本研究將背景壓力抽至低真空下製備,因此可縮減抽至高真空所需的時間,故利用本製程可省去抽真空所需之時間與成本,進而達到環保節能的目的。 本研究之結果顯示從熱力學分析中,在低真空下,Al會氧化成Al2O3,但本實驗在低真空下,通入氬氣成功製備出Al薄膜,以及通入氮氣與氬氣之混合氣體成功鍍著出AlN薄膜,此結果與熱力學的預測並不符合,因此電漿中通入Ar形成Al薄膜與通入氮氣形成AlN是動力學控制所造成之結果。
URI: http://hdl.handle.net/11455/10868
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