Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/11513
標題: 鎳鐵/鉻薄膜微結構及磁性質之研究
Microstructures and Magnetic Properties of NiFe/Cr Thin Films
作者: 陳怡華
Chen, I-Hua
關鍵字: 鎳鐵
NiFe

交換耦合
Cr
exchange coupling
出版社: 材料科學與工程學系所
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摘要: 摘 要 本研究主要利用雙離子束濺鍍系統,在矽基板上製備鎳鐵/鉻薄膜之雙層薄膜,並利用X-ray繞射分析確認其晶格結構、穿透式電子顯微鏡(TEM) 進行晶粒大小、成分結構與薄膜厚度等分析,並與XRD的分析結果進行比對驗證。鎳鐵/鉻雙層薄膜之鎳鐵層具有面心立方(F.C.C)結構,晶格常數為3.55Å,而鉻層為體心立方(B.C.C)結構,晶格常數為2.884 Å。晶粒大小為介於5~15nm之間。 在磁性質方面,使用震動樣品磁力計(VSM)磁性量測室溫下(T=298K)、外加磁場沿著平行膜面及垂直膜面量測之磁滯曲線圖,可得知試片於平行膜面量測時達到飽和所需的外加場較垂直膜面量測時來的小,由此可知此試片有平行膜面方向的易磁化軸。另外,在室溫下NiFe/Cr薄膜具有非常微弱的交換偏壓(Hex~0.2 Oe),表示在室溫下觀察到有非常微弱的交換耦合現象,這是由於反鐵磁層(Cr)的尼爾溫度(Cr~311K)高於室溫。而在T=160K時,有較高之交換偏壓(Hex~1.2 Oe),因溫度較室溫更低於反鐵磁層之尼爾溫度,故交換偏壓有些為提升,因此也具有交換耦合之現象。由於298K溫度較160K高,故晶格因熱能而引起的晶格震動幅度較大,因此在298K時的交換耦合現象較160K時來的微弱。
Abstract The composite films of Ni80Fe20/Cr on Si substrate was prepared by dual ion-deposition technique. The structural and magnetic properties of the composite films were studied by X-ray diffraction (XRD), transmission electron microscopy (TEM), Vibrating sample magnetometer (VSM), respectively. XRD results have shown that the Ni80Fe20 layer consisted of F.C.C. with a=3.55Å and Cr layer consisted of B.C.C. with a=2.884Å. TEM results have shown that the grain sizes of polycrystalline composite films range from 5nm to 15nm. Magnetic properties at room temperature (T = 298K) and magnetic field along the parallel and perpendicular to the film surface have been measured, results showed that the easy axis of the specimen is in-plane. In addition, Ni80Fe20 / Cr film exhibits very weak exchange bias field (Hex~0.2 Oe) at room temperature, and the exchange coupling interaction, because Neel’s temperature of Cr, (Cr ~ 311K) is higher than room temperature. At 160K, due to lower thermal fluctuation, the exchange bias field raise to 1.2 Oe.
URI: http://hdl.handle.net/11455/11513
其他識別: U0005-1008201217252300
文章連結: http://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-1008201217252300
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