Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/16980
標題: Electronic and Magnetic Properties of C84 Embedded Si(111) Surfaces
碳八十四分子埋入矽基板的電性與磁性研究
作者: 邱凡芸
Chiu, Fan-Yun
關鍵字: C84
碳八十四
STM
MFM
electronic properties
magnetic properties
掃描穿隧顯微鏡
磁力顯微鏡
電性
磁性
出版社: 物理學系所
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摘要: 碳八十四為橢圓形結構的傅勒烯分子,根據先前的研究顯示,碳六十傅勒烯分子磁偶合單元中心彼此的相對位置,由此產生的交互作用會產生鐵磁性或反鐵磁性;半導體鍺材料達到奈米尺寸形成鍺量子點時會造成能階分裂,使得未成對電子的比例提升,再藉由適當的距離鍺的自由電子彼此交互作用,使鍺量子點產生磁性訊號。本實驗利用可變溫式超高真空掃描穿隧顯微鏡觀測嵌入在矽(111)表面的碳八十四分子表面形貌,並利用掃描穿隧能譜量測其電性。並將樣品送至超導量子干涉儀(Superconducting Quantum Interference Device, SQUID)做磁性量測,並利用磁力顯微鏡去觀測嵌入在矽(111)表面的碳八十四分子的磁力影像,認為此樣品中的碳八十四分子團簇為單一磁疇,並在大範圍掃描中可發現碳八十四分子團簇分佈不均。此研究結果可知,嵌入在矽(111)表面的碳八十四分子具有磁性。
C84 is fullerene molecule with elliptical shape. According to previous studies, C60 molecular as a magnetic coupling unit, depending on the relative position of the two radical centers interaction, leads to ferro or antiferromagnetic behavior. Semiconductor Ge quantum dots energy band separates into many energy levels with unpaired spins. The unpaired spins in Ge quantum dots are coupled to one another through free electrons in Ge thin film. It is the reason of observed magnetism in Ge quantum dots. In this experiment, ultrahigh-vacuum scanning tunneling microscopy was used to observe the topography of C84 embedded in Si(111) surface, the scanning tunneling spectroscopy was used to measure the electronic characteristic, the superconducting quantum interference device was used to measure the magnetic characteristic, the magnetic force microscopy was used to observe the surface magnetic properties. We consider that C84 cluster is a single magnetic domain, and the C84 cluster distributed non- uniform. According to these result, C84 embedded in Si(111) surface possesses magnetism.
URI: http://hdl.handle.net/11455/16980
其他識別: U0005-0601201211231700
文章連結: http://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-0601201211231700
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