Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/16983
標題: Design and Construction of a Confocal Microscope for Low-Temperature and High-Magnetic-Field Applications
設計和建構低溫高磁共焦顯微鏡量測系統
作者: 郭鴻榮
Kuo, Hong-Rong
關鍵字: confocal microscope
共焦顯微鏡
出版社: 物理學系所
引用: [1] Slater E. M. and Slater H. S., 1993 Light and Electron Microscopy (Cambridge: Cambridge University Press). [2] Jun-ichi Kasai, Yoshifumi Katayama,Rev. Sci. Instrum., Vol.66, No.7, July (1995) [3] Fabio Grazioso, Brian R. Patton, and Jason M. Smith, Rev. Sci. Instrum. 81, 093705 (2010) [4] A. Högele, S. Seidl, M. Kroner, K. Karrai, C. Schulhauser, O. Sqalli, J.Scrimgeour, and R. J. Warburton, Rev. Sci. Instrum. 79, 023709 (2008) [5] S. Kimura and T. Wilson, Appl. Opt. 30, 2143 (1991). [6] Wilson T. (ed) 1990 Confocal Microscopy (London: Academic). [7] T. Yamazaki, I. Komuro, and Y. Yazaki, J. Mol. Cell Cardiol. 27,133 (1995). [8] G. Q. Xiai, T. R. Corle, and G. S. Kine, “Real-time confocal scanning optical microscope”, Appl. Phy. Lett., Vol. 53, pp. 716,1988. [9] T. Wilson and C. J. R. Sheppard, Theory and practice of scanning optical microscopy, (Academic Press, London, 1984). [10] C.J.R. Sheppard and D.M. Shotton, Confocal Laser Scanning Microscopy, (Springer, New York, 1997). [11] M. Gu, Three dimensional confocal microscopy, (World Scientific, Singapore, 1996). [12] Stevens J. K., Mills L. R. and Trogadis J. (eds) 1993 Three-Dimensional Confocal Microscopy (San Diego, CA: Academic). [13] Pawley 1991 J B Fundamental and practical limits in confocal light microscopy Scanning 13 184-98. [14] Wilson T. 1985 Scanning optical microscopy Scanning 7 79-87. [15] M. Born and E. Wolf, Principles of Optics (Pergamon Press,Oxford, 1980). [16] Robert H. Webb, "Confocal optical microscopy" Rep. Prog. Phys. 59 (1996) 427-471. [17] Richards B. and Wolf E., "Electromagnetic diffraction in optical systems II. Structure of the image field in an aplanatic system" Proc. R. Soc. A 253 (1959) 358-379. [18] C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy, Ch3, 1997. [19] Touloukhian,1970,and NBS 29 [20] Huang, Kuang-Lung; Maxwell, Jonathan,Proc. SPIE Vol.2774 ,Design and Engineering of Optical Systems,Joseph J. Braat; Ed.(1996) [21] Rachel Noek, Caleb Knoernschild, Justin Migacz, Taehyun Kim, Peter Maunz, True Merrill, Harley Hayden, C.S. Pai, and Jungsang Kim. Optics Letters (Duke University) (June 2010). [22] D. W. Pohl, Rev. Sci. Instrum. 58, 54 (1987). [23] C. Renner, P. Niedermann, A. D. Kent, and O. Fischer, Rev. Sci. Instrum. 61, 965 (1990). [24] “Scanning Near-Field Optical Microscope attoSNOM III“, attocube systems AG, Koniginstr. 11a Rgb D-80539 (2007)
摘要: 我們設計和建構一組適合於低溫且高磁場環境之共焦顯微鏡量測系統,系統溫度可以降至4.2K,而磁場可加到14T。受限於低溫系統杜瓦瓶的長度限制,該系統光路長達1600mm,是一般顯微鏡的好幾倍,因此像差也隨之放大。我們利用ZEMAX軟體進行模擬設計,搭配不同的透鏡組合使像差減至最小;物鏡部份是由兩片平凸透鏡和一片平凹透鏡組成,因為需置於低溫環境下,所以材質選用fused silica;Tube Lens部份則是由兩片平凸透鏡組成,成像系統的放大率為四倍。在probe系統設計上會裝設CCD,可以同步監控樣品位置,而成像系統的光源選用紅光LED來照明,置於樣品和物鏡間。另外,在放置樣品處,會裝設XYZ的positioner,可以在低溫下移動樣品位置,並使用CCD來達到校準。此系統設計的方式,可以直接在室溫作收光,取代光纖至低溫作收光。此論文將說明此系統的架設和展示初步測試結果。
We design a confocal optical microscope system for probing samples in a low-temperature (4.2 K) and high-magnetic-field (14 T) environment. Due to the limitation of the conventional cryogenic dewar, this system has a very long optical path of 1600 mm compared to a trpical microscope, causing a very large aberration. We carefully adjust the lens configuration to reduce the aberration by using ZEMAX simulation. The objective lens, which will be in the low temperature environment, with a 50 mm focal length is composed of two plano-convex and a plano-concave fused silica lenses. The tube lens in the optical head is made up of two plano-convex lenses and with a 200 mm focal length. The magnification of this optical system is about four times. CCD camer device is cooperated to monitor the sample and a red light emitted diodes (LEDs) is adapted as the light source of the optical microscope due to the limit of wavelength of the dichroic mirror. We placed these LEDs in a housing between the objective lens and sample. In front of the CCD, we install a lens set to control fields of view. The sample stage is equipped with a XY scanner and three positioners made from Attocube, and its housing is totally made of Titanium. The mechanical assemblage and preliminary results will be presented.
URI: http://hdl.handle.net/11455/16983
其他識別: U0005-0607201122323700
文章連結: http://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-0607201122323700
Appears in Collections:物理學系所

文件中的檔案:

取得全文請前往華藝線上圖書館



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.