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Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage
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In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewed-load delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test fault coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance will not be significant.
|Appears in Collections:||資訊科學與工程學系所|
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