Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/3003
標題: 奈米粒子複合介電層與可撓式a-IGZO薄膜電晶體之研究
Nanocomposite Dielectric for Flexible a-IGZO Thin Film Transistors
作者: 簡俊睿
Jian, Jyun-Ruei
關鍵字: 奈米粒子
Nanoparticle
IGZO
複合式介電層
薄膜電晶體
IGZO
Nanocomposite dielectric
Thin-film transistors
出版社: 光電工程研究所
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摘要: 在本實驗中,吾人利用有機高分子聚合物(PVP)與無機氧化鋁之奈米粒子(<50nm),形成一種奈米粒子複合介電層來當作a-IGZO薄膜電晶體之絕緣層。第一先使用MIM結構去測試閘極介電層之最佳化參數,之後將最佳化參數之閘極介電層分別應用在玻璃基板與塑膠基板(PEN)上,並分別展現出不錯的特性,除此之外,也發現加了氧化鋁後的閘極介電層具有使元件始終維持在增強型(enhancement mode)元件,還會使奈米粒子複合式閘極介電層之薄膜電晶體再經由100次撓曲後還具有不錯之特性。在加入氧化鋁前,其載子遷移率為0.48 cm2/V-s,臨界電壓為0.3V,電流開關比為104與次臨界擺幅為0.98V/dec,而在加入氧化鋁後,其載子遷移率可提升至5.01 cm2/V-s,臨界電壓為1.9V,電流開關比為106與次臨界擺幅為1.2V/dec。
In this thesis, we study a nanocomposite dielectric for flexible a-IGZO Thin Film Transistors, it combines both organic polymer PVP and inorganic nanoparticle aluminum oxide to perform the gate dielectric.The uniqe advantage of the gate dielectric is that simple and solution process, first we find the optimization parameter of gate dielectric which used as a MIM structure, and we spin coated the gate dielectric in the glass and PEN substrate.In combination of both organic and inorganic gate dielectric electrical characterization was well and good, and we found two major advantages one is thate always in the enhancement mode, and the other one is robust when it is bending more than one hundred times.The TFT performance was without adding Al2O3 was exhibit 0.48 cm2/V-s of mobility, 0.3 V of threshold voltage, 104 of on off ratio and 0.98V/dec of subthreshold swing, and after adding the Al2O3 the TFT was improved to 5.01 cm2/V-s of mobility, 1.9 V of threshold voltage, 106 of on off ratio and 1.2V/dec of subthreshold swing.
URI: http://hdl.handle.net/11455/3003
其他識別: U0005-2407201217172600
文章連結: http://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-2407201217172600
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