Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/36373
標題: Normal approximation to the distribution of the estimated yield index S-pk
作者: Pearn, W.L.
王國雄
Lin, G.H.
Wang, K.H.
關鍵字: critical value
process yield
期刊/報告no:: Quality & Quantity, Volume 38, Issue 1, Page(s) 95-111.
摘要: Process yield is the most common criterion used in the manufacturing industry for measuring process performance. A measurement index, called S-pk, has been proposed to calculate the yield for normal processes. The measurement index S-pk establishes the relationship between the manufacturing specifications and the actual process performance, which provides an exact measure on process yield. Unfortunately, the sampling distribution of the estimated S-pk is mathematically intractable. Therefore, process performance testing cannot be performed. In this paper; we consider a normal approximation to the distribution of the estimated S-pk, and investigate its accuracy computationally. We compare the critical values calculated from the approximate distribution with those obtained using the standard simulation technique, for various commonly used quality requirements. Extensive computational results are provided and analyzed. The investigation is useful to the practitioners for making decisions in testing process performance based on the yield.
URI: http://hdl.handle.net/11455/36373
ISSN: 0033-5177
文章連結: http://dx.doi.org/10.1023/B:QUQU.0000013245.13104.1d
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