Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/37688
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dc.contributor.authorWang, S.J.en_US
dc.contributor.author王行健zh_TW
dc.contributor.authorLi, K.S.M.en_US
dc.contributor.authorChen, S.C.en_US
dc.contributor.authorShiu, H.Y.en_US
dc.contributor.authorChu, Y.L.en_US
dc.date2009zh_TW
dc.date.accessioned2014-06-06T07:59:58Z-
dc.date.available2014-06-06T07:59:58Z-
dc.identifier.issn0278-0070zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/37688-
dc.description.abstractThe degree of achievable test-data compression depends on not only the compression scheme but also the structure of the applied test data. Therefore, it is possible to improve the compression rate of a given test set by carefully organizing the way that test data are present in the scan structure. The relationship between signal probability and test-data entropy is explored in this paper, and the results show that the theoretical maximum compression can be increased through a partition of scan flip-flops such that the test data present in each partition have a skewed signal distribution. In essence, this approach simply puts similar scan flip-flops in an adjacent part of a scan chain, which also helps to reduce shift power in the scan test process. Furthermore, it is shown that the intrapartition scan-chain order has little impact on the compressibility of a test set; thus, it is easy to achieve higher test compression with low routing overhead. Experimental results show that the proposed partition method can raise the compression rates of various compression schemes by more than 17%, and the average reduction in shift power is about 50%. In contrast, the increase in routing length is limited.en_US
dc.language.isoen_USzh_TW
dc.relationIeee Transactions on Computer-Aided Design of Integrated Circuits and Systemsen_US
dc.relation.ispartofseriesIeee Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 28, Issue 5, Page(s) 716-727.en_US
dc.relation.urihttp://dx.doi.org/10.1109/tcad.2009.2015741en_US
dc.subjectEntropy theoryen_US
dc.subjectroutingen_US
dc.subjectscan-based designen_US
dc.subjecttest poweren_US
dc.subjecttest-dataen_US
dc.subjectcompressionen_US
dc.subjecta-chip testen_US
dc.subjectcombinational-circuitsen_US
dc.subjecttest patternsen_US
dc.subjectip coresen_US
dc.subjectreductionen_US
dc.subjectcompactionen_US
dc.subjectvolumeen_US
dc.subjectcodesen_US
dc.titleScan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constrainten_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1109/tcad.2009.2015741zh_TW
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