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標題: (VLSI Design:An International Journal of Custom-Chip Design,Simulation and Testing,00(0):001-018)Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis
作者: W. B. Jone
D. C. Huang
S. C. Chang
S. R. Das
關鍵字: Defect level analysis
Random testing
Pseudorandom testing
Markov model
Di fferential equations
出版社: Malaysia: the Gordon and Breach Science Publishers
Appears in Collections:資訊科學與工程學系所



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