Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/42377
標題: How knowledge map fit and personalization affect success of KMS in high-tech firms
作者: Lai, J.Y.
賴榮裕
Wang, C.T.
Chou, C.Y.
關鍵字: Effectiveness
IS success
Knowledge management systems (KMS)
Knowledge
map fit
Personalization
User satisfaction
information-systems
user satisfaction
management-systems
model
technology
creation
validation
acceptance
business
barriers
期刊/報告no:: Technovation, Volume 29, Issue 4, Page(s) 313-324.
摘要: The shift from it product-based to a knowledge-based economy has resulted in all increasing demand for organizations to implement knowledge management systems (KMS) at in accelerating pace. However, factors influencing success of KMS have seldom been empirically examined by prior research, particularly how knowledge map fit and personalization influence employee satisfaction with KMS, which is it surrogate measure of the success/effectiveness of information systems (IS). Results from a sample of 133 employees, mostly from four international high-tech companies in the Hsin-Chu Science-based Industrial Park in Taiwan, help us better understand what factors affect employee satisfaction with KMS. The result shows that KMS with a higher level of knowledge map fit and personalization will satisfy employees directly or indirectly through the mediation effects of increased perceptions of case of use and usefulness of KMS. Our findings could serve as useful references for researchers and practitioners interested in investigating issues related to the successful implementation of KMS. (C) 2008 Elsevier Ltd. All rights reserved.
URI: http://hdl.handle.net/11455/42377
ISSN: 0166-4972
文章連結: http://dx.doi.org/10.1016/j.technovation.2008.10.007
Appears in Collections:科技管理研究所

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