Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43262
標題: Structural phase transition of AgOx sandwiched between ZnS-SiO2 protective layers under thermal and laser pulse annealing for super-resolution near-field recording
作者: Her, Y.C.
何永鈞
Lan, Y.C.
Hsu, W.C.
Tsai, S.Y.
關鍵字: AgOx
super-RENS disk
non-linear optical layer
chemical decomposition
recording and readout mechanisms
silver-oxide layer
optical transmittance
decomposition
期刊/報告no:: Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, Volume 43, Issue 11A, Page(s) 7519-7523.
摘要: The as-deposited AgOx prepared at an oxygen flow ratio of 0.5 consisted of Ag2O and AgO phases. During thermal annealing, the reduction of AgO into Ag2O, decomposition of Ag2O into Ag and O-2, and out diffusion and aggregation of decomposed Ag would take place successively. The chemical decomposition of AgO, film sandwiched between two ZnS-SiO2 Protective layers was confirmed to be an irreversible process. As being irradiated by a high power laser pulse similar to the recording process, a hollow Ag cylinder, or ring, serving as an aperture, was formed in the AgOx mask layer, and small Ag particles, serving as light-scattering centers, were precipitated in the center region. During the readout process, the small aperture can significantly reduce the readout laser spot size, while the strong near-field interaction between precipitated Ag particles and sub-wavelength marks can effectively enhance the readout signal. That elucidates the recording and readout mechanisms of super-resolution near-field structure disk with an AgOx mask layer.
URI: http://hdl.handle.net/11455/43262
ISSN: 0021-4922
文章連結: http://dx.doi.org/10.1143/jjap.43.7519
Appears in Collections:材料科學與工程學系

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