Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43563
標題: Study on the Solidus Line in Sn-Rich Region of Sn-In Phase Diagram
作者: Yeh, C.H.
張立信
Chang, L.S.
Straumal, B.
關鍵字: binary system
grain boundary wetting
phase diagram
Sn-In alloy
solidus line
free solder materials
interfacial reactions
system
zn
期刊/報告no:: Journal of Phase Equilibria and Diffusion, Volume 30, Issue 3, Page(s) 254-257.
摘要: Binary phase diagrams are important tools for designing desired alloys. In the Sn-rich region of the Sn-In alloy phase diagram, the solidus line appears as a dotted line in current literature plots to indicate uncertainty. The contour of the solidus has now been clarified as a result of the present investigation. Four alloys, Sn(70)In(30), Sn(75)In(25), Sn(80)In(20), and Sn(85)In(15) were melted at 300 A degrees C for 10 h and annealed between 120 and 200 A degrees C in the (L + gamma) two-phase region. The morphology and chemical compositions of annealed specimens were analyzed using both field emission scanning electron spectroscopy and energy-dispersive x-ray spectrometry. The results reveal that the liquid phase, initially appearing at the eutectic temperature, invades the solid along grain boundaries with penetration gradually increasing with increasing annealing temperature and a granular structure form. The average compositions in grains of Sn(70)In(30), Sn(75)In(25), Sn(80)In(20), and Sn(85)In(15) specimens correspond to the solidus concentrations, and the solidus line and (beta + gamma)/gamma phase boundary can be determined as a fit to these temperature-composition points.
URI: http://hdl.handle.net/11455/43563
ISSN: 1547-7037
文章連結: http://dx.doi.org/10.1007/s11669-009-9505-2
Appears in Collections:材料科學與工程學系

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