Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/51417
標題: RTL Testing for SoC
系統晶片環境中暫存器傳遞層測試之研究
作者: 王行健
關鍵字: 電子電機工程類
基礎研究
URI: http://hdl.handle.net/11455/51417
其他識別: NSC92-2218-E005-007
文章連結: http://grbsearch.stpi.narl.org.tw/GRB/result.jsp?id=874679&plan_no=NSC92-2218-E005-007&plan_year=92&projkey=PB9208-2566&target=plan&highStr=*&check=0&pnchDesc=%E7%B3%BB%E7%B5%B1%E6%99%B6%E7%89%87%E7%92%B0%E5%A2%83%E4%B8%AD%E6%9A%AB%E5%AD%98%E5%99%A8%E5%82%B3%E9%81%9E%E5%B1%A4%E6%B8%AC%E8%A9%A6%E4%B9%8B%E7%A0%94%E7%A9%B6
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