Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/51630
標題: Built-In-Self-Test and Its Application under High-Level Design
內建自我測試及其在高層設計中應用之分析
作者: 王行健
關鍵字: 電子電機工程類
基礎研究
URI: http://hdl.handle.net/11455/51630
其他識別: NSC89-2215-E005-004
文章連結: http://grbsearch.stpi.narl.org.tw/GRB/result.jsp?id=720172&plan_no=NSC89-2215-E005-004&plan_year=89&projkey=PB9106-0579&target=plan&highStr=*&check=0&pnchDesc=%E5%85%A7%E5%BB%BA%E8%87%AA%E6%88%91%E6%B8%AC%E8%A9%A6%E5%8F%8A%E5%85%B6%E5%9C%A8%E9%AB%98%E5%B1%A4%E8%A8%AD%E8%A8%88%E4%B8%AD%E6%87%89%E7%94%A8%E4%B9%8B%E5%88%86%E6%9E%90
Appears in Collections:資訊科學與工程學系所

文件中的檔案:

取得全文請前往華藝線上圖書館



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.