Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/56827
標題: 以近紅外線分光術探討大豆品質劣變之作用機制並預估加工品質可行性之研究
Studies on Mechanism of Soybean Quality Deterioration and Evaluation of Soyproduct Quality by Near Infrared Reflectance Spectroscopy
作者: 蔡順仁
鄒箎生
關鍵字: 食品科技
基礎研究
URI: http://hdl.handle.net/11455/56827
其他識別: NSC83-0406-E005-001
文章連結: http://grbsearch.stpi.narl.org.tw/GRB/result.jsp?id=112257&plan_no=NSC83-0406-E005-001&plan_year=83&projkey=PS8301-2739&target=plan&highStr=*&check=0&pnchDesc=%E4%BB%A5%E8%BF%91%E7%B4%85%E5%A4%96%E7%B7%9A%E5%88%86%E5%85%89%E8%A1%93%E6%8E%A2%E8%A8%8E%E5%A4%A7%E8%B1%86%E5%93%81%E8%B3%AA%E5%8A%A3%E8%AE%8A%E4%B9%8B%E4%BD%9C%E7%94%A8%E6%A9%9F%E5%88%B6%E4%B8%A6%E9%A0%90%E4%BC%B0%E5%8A%A0%E5%B7%A5%E5%93%81%E8%B3%AA%E5%8F%AF%E8%A1%8C%E6%80%A7%E4%B9%8B%E7%A0%94%E7%A9%B6
Appears in Collections:食品暨應用生物科技學系

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