Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/68069
標題: Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O-2 electrodes
作者: Chang, L.S.
Lin, Y.C.
Su, C.Y.
Wu, H.C.
Pan, J.P.
關鍵字: XPS
Depth profile
Ion sputtering
C60
Li(Ni,Co,Mn)O-2
graphite electrode
batteries
capability
chemistry
cathode
期刊/報告no:: Applied Surface Science, Volume 258, Issue 3, Page(s) 1279-1281.
摘要: The performance of a Li-ion cell strongly depends on the solid-electrolyte interface (SEI) on electrodes. The depth distribution of composition in SEI is normally determined by means of X-ray Photoelectron Spectroscopy (XPS) via Ar ion sputtering. Recently, a new kind of ion gun using C60 ions as sputtering source was introduced. In this report, a comparison between the effects of these two kinds of ion guns on the quantification of Li(Ni,Co,Mn)O-2 electrodes was made. It was found that the C60 ion gun is more suitable for analyzing the composition and chemical state of Li(Ni,Co,Mn)O-2 electrode since that it causes lower chemical damage in the superficial layer. (C) 2011 Elsevier B.V. All rights reserved.
URI: http://hdl.handle.net/11455/68069
ISSN: 0169-4332
文章連結: http://dx.doi.org/10.1016/j.apsusc.2011.08.087
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