Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69173
標題: Direct observation of silver atoms on Si(111)-7 x 7 surfaces
作者: Ho, M.S.
Su, C.C.
Tsong, T.T.
關鍵字: scanning tunneling microscopy (STM)
silicon
silver
surface dynamics
scanning-tunneling-microscopy
cu/si(111) quasi-5x5 overlayer
si atoms
ag
growth
au
cu
au/si(111)
diffusion
phase
期刊/報告no:: Ieee Transactions on Nanotechnology, Volume 5, Issue 5, Page(s) 530-534.
摘要: The dynamics of single silver atoms adsorbed on the Si(111)-7 x 7 surface has been studied between 300 K and 423 K with a variable-temperature scanning tunneling microscope. We discuss the diffusion behavior of one and two silver atoms when they diffuse into a half unit cell of the 7 x 7 reconstructed Si(111) surface. Detailed tracking of the movements of individual silver atoms within a 7 x 7 half unit cell was done at similar to 80 K. The activation energies and preexponential factors for different diffusion paths were estimated. Finally, possible mechanisms of silver atom diffusion on the Si(111)-7 x 7 surface are proposed based on both our data and those recently published by others.
URI: http://hdl.handle.net/11455/69173
ISSN: 1536-125X
文章連結: http://dx.doi.org/10.1109/tnano.2006.880443
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