Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69582
DC FieldValueLanguage
dc.contributor.authorLin, K.W.en_US
dc.contributor.authorLin, F.T.en_US
dc.contributor.authorTzeng, Y.M.en_US
dc.date2005zh_TW
dc.date.accessioned2014-06-11T05:58:32Z-
dc.date.available2014-06-11T05:58:32Z-
dc.identifier.issn0021-4922zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/69582-
dc.description.abstractA series of Ni80Fe20/Cobalt oxide bilayers were prepared by a dual ion-beam deposition technique that produced a layer composition that varied from rock-salt COO (a = 4.27 angstrom) to spinel Co3O4 (a = 8.21 angstrom) with increasing O-2 content in the assist beam. Each polycrystalline layer (similar to 20 nm) exhibited a columnar structure perpendicular to the film surface. A strong temperature dependence of coercivity H-c and exchange bias field He, was found in these Ni80Fe20/cobalt oxide bilayers. At T = 10 K, films prepared with 34% O-2 in the assist beam exhibited an exchange shift H-ex similar to -200 Oe that persisted at temperatures higher than 30 K. The variations in H-c and H-ex as a function of %O-2 are related to the interfacial roughness and magnetic state of COO or Co3O4. The transition temperature of Co3O4 has increased above the bulk value via exchange coupling with the permalloy.en_US
dc.language.isoen_USzh_TW
dc.relationJapanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papersen_US
dc.relation.ispartofseriesJapanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers, Volume 44, Issue 6A, Page(s) 3932-3935.en_US
dc.relation.urihttp://dx.doi.org/10.1143/jjap.44.3932en_US
dc.subjectexchange couplingen_US
dc.subjectexchange biasen_US
dc.subjectMRAMen_US
dc.subjectNiFe/cobalt oxide bilayersen_US
dc.subjection-beam deposition techniqueen_US
dc.subjectmagnetic-propertiesen_US
dc.subjectbiasen_US
dc.titleAntiferromagnetic layer structure effects on exchange coupling strength in ion-beam deposited Ni80Fe20/cobalt oxide bilayersen_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1143/jjap.44.3932zh_TW
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