Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/93888
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dc.contributor.authorJiang, Cheng-Weizh_TW
dc.contributor.authorNi, I-Chihzh_TW
dc.contributor.authorTzeng, Shien-Derzh_TW
dc.contributor.authorKuo, Watsonzh_TW
dc.date2015-
dc.date.accessioned2016-07-25T06:17:24Z-
dc.date.available2016-07-25T06:17:24Z-
dc.identifier.urihttp://hdl.handle.net/11455/93888-
dc.description.abstractPiezoresistive responses of nanoparticle thin-film strain sensors on flexible polyimide substrates were studied. Disordered interparticle tunneling introduces microscopic detour of charge conduction so as to reduce gauge factors. The disorder also results in large resistance change when current flows in the direction perpendicular to a unidirectional strain, reducing response anisotropy. For practical usages, stability and endurance of these strain sensors are confirmed with 7 × 10(4) bending cycles. Cracks form in devices under prolonged cyclic bending and slightly reduce gauge factor.zh_TW
dc.language.isoenzh_TW
dc.relationScientific reports, Volume 5, Page(s) 11939.zh_TW
dc.titleNearly isotropic piezoresistive response due to charge detour conduction in nanoparticle thin filmszh_TW
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1038/srep11939zh_TW
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