Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/93977
標題: Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-Cr](50) thin films
作者: Chao Zheng
Ko-Wei Lin
Chi-Hsin Liu
Hsun-Feng Hsu
Chi-Wah Leung
Wei-Hsien Chen
Te-Ho Wu
Ryan D. Desautels
Johan van Lierop
Philip W.T. Pong
URI: http://hdl.handle.net/11455/93977
Appears in Collections:材料科學與工程學系

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