Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/94574
標題: Flexural Capability of Patterned Transparent Conductive Substrate by Performing Electrical Measurements and Stress Simulations
作者: Lee, Chang-Chun
Huang, Pei-Chen
Wang, Ko-Shun
李昌駿
關鍵字: bending strain
bending test
finite element analysis
patterned ITO/PET film
sheet resistance
摘要: The suitability of stacked thin films for next-generation display technology was analyzed based on their properties and geometrical designs to evaluate the mechanical reliability of transparent conducting thin films utilized in flexural displays. In general, the high bending stress induced by various operation conditions is a major concern regarding the mechanical reliability of indium-tin-oxide (ITO) films deposited on polyethylene terephthalate (PET) substrates; mechanical reliability is commonly used to estimate the flexibility of displays. However, the pattern effect is rarely investigated to estimate the mechanical reliability of ITO/PET films. Thus, this study examined the flexible content of patterned ITO/PET films with two different line widths by conducting bending tests and sheet resistance measurements. Moreover, a stress-strain simulation enabled by finite element analysis was performed on the patterned ITO/PET to explore the stress impact of stacked film structures under various levels of flexural load. Results show that the design of the ITO/PET film can be applied in developing mechanically reliable flexible electronics.
URI: http://hdl.handle.net/11455/94574
ISSN: 1996-1944
Appears in Collections:機械工程學系所

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