Browsing by Author Tsai, C.J.

Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)Text
-Design issues of two-dimensional amorphous silicon position-sensitive detectorsShung, J.Y.; Hsu, K.Y.J.; Jiang, Y.L.; Tsai, C.J.-
-Effects of stress on the growth of TiSi2 thin films on (001)SiCheng, S.L.; Huang, H.Y.; Peng, Y.C.; Chen, L.J.; Tsui, B.Y.; Tsai, C.J.; Guo, S.S.-
-Formation of TiSi2 thin films on stressed (001)Si substratesCheng, S.L.; Huang, H.Y.; Peng, Y.C.; Chen, L.J.; Tsui, B.Y.; Tsai, C.J.; Guo, S.S.; Yang, Y.R.; Lin, J.T.-
-Influences of pH and hydraulic retention time on anaerobes converting beer processing wastes into hydrogenLay, J.J.; Tsai, C.J.; Huang, C.C.; Chang, J.J.; Chou, C.H.; Fan, K.S.; Chang, J.I.; Hsu, P.C.-
-Microporous layer structure in oxidized aluminium nitride polycrystalsTseng, W.J.; 曾文甲; Tsai, C.J.-
-Physiological characteristics of glufosinate resistance in rice王慶裕; Tsai, C.J.; Wang, C.S.; Wang, C.Y.-
-Reaction sequence of Co/Ni/Si(001) systemGuo, S.S.; Tsai, C.J.-
-Stress evolution during isochronal annealing of Ni/Si systemTsai, C.J.; Yu, K.H.-
-Stress evolution in Co/Ti/Si systemGuo, S.S.; Chu, Y.C.; Tsai, C.J.-
-Stress evolution of Ni/Pd/Si reaction system under isochronal annealingTsai, C.J.; Chung, P.L.; Yu, K.H.-
-The Young's modulus of chromium nitride filmsChen, H.Y.; 呂福興; Tsai, C.J.; Lu, F.H.-