Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/1683
標題: 電子斑點干涉術應用於靜態位移與振動模態檢測之研究
The research of applying ESPI to measurement static displacement and vibration mode shape
作者: 洪毓政
Hong, Yiu-gin
關鍵字: 斑點;speckle;電子斑點干涉術;ESPI
出版社: 機械工程學系
摘要: 
本文之研究目的在於如何將CCD相機與斑點量測技術結合應用。主要可
分為兩部分:電子斑點照相術、電子斑點干涉術。第一章將介紹斑點的基
礎,以增加對它的了解。同時說明斑點量測技術的發展。大略可分為斑點
照相術與斑點干涉術兩種量測技術。第二章開始介紹斑點照相術的量測原
理,並且探討相機代替底片時,有何考量。進而架設一電子斑點照相術量
測系統,並以實驗驗證之。第三章則介紹電子斑點干涉術(ESPI)於面內
、面外靜態變形與振動模態檢測之應用,並針對振動檢測的兩種方法:傳
統相減法、振幅變動法做比較。最後於第四章做結論。

The purpose of this reasearch is how to combine CCD with
speckle.It can be devided to two part:Electronic Speckle
Photography、Ele-ctronic Speckle Pattern Interferometry.The
Chap1 introduces the ba-sis of speckle for understanding well.
And explains the development of speckle measurement technology.
One is Speckle Photography and the other is Speckle Pattern
Interferometry.The Chap2 introduces the pr-inciple of Speckle
Photography and discuss what is the considerable when the CCD
substitutes the film.And establish speckle photography
measurement system,then testand verify with experiment.The Chap3
apply the ESPI to measurement the in-plane、out-plane and
vibration,then the tradition subtraction method compares with
the amplitude fluctuation.Conclusion in Chap4.
URI: http://hdl.handle.net/11455/1683
Appears in Collections:機械工程學系所

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