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標題: 結合擬合誤差與影像對比進行多形貌不連續之定位研究
Retrieval of phase maps with multiple-physical discontinuities by the hybrid of image process technique & least square error
作者: 林建彰
Lin, Chien-Chang
關鍵字: Minimum LP-norm;Minimum LP–norm;ESPI;optical measurement;least square error;image processdiscontinuity;雷射斑點干涉術;光學量測;擬合誤差;影像對比;形貌不連續
出版社: 機械工程學系所
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目前的相位展開技術已可以有效解決高雜訊的包裹相位圖,現在有待克服的是包裹相位圖具有高雜訊且本身存在不連續的現象的問題。本論文主要是以Minimum LP–norm與區塊接合理論作為相位展開技術的主要方法,利用擬合誤差與影像對比來判斷並修正區塊中搬移錯誤的部分,使得相位能順利展開完成。

The present phase unwrapping technology has solved the problem that the fringe map has high miscellaneous signals. The problems we need to overcome are the wrapped map with high miscellaneous signals and discontinuity phenomenon.
The main approach to phase unwrapping technology in my paper is based on Minimum LP-norm. With submap-stitching theory, the image process technique and least square error are used to estimate the wrong submaps and to modify the wrong submaps. This enables phase unwrapped successfully.
We simulate the wrapped phase maps of different types of physical discontinuities, and examine the wrapped phase maps which are physically discontinuous with electronic speckle pattern interferometry. We adopt least square error to estimate the wrong submaps and use image process technique to find out points of physical discontinuities and use those points to fit lines of physical discontinuities. Therefore, we are able to modify wrong submaps efficiently. The modified unwrapped phase maps are compared with original correct phase maps. The probability of error would be reduced under one percent.
其他識別: U0005-0908200715295700
Appears in Collections:機械工程學系所

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