Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/1816
標題: 非接觸式不連續形貌輪廓檢測技術研究
On the detection technique of solving 3D maps with physical discontinuities
作者: 戴賢輝
Dai, Xian-Hui
關鍵字: electronic speckle pattern interferometry;電子斑點干涉術;structured light;moire;結構光;疊紋法
出版社: 機械工程學系所
引用: [1] R.Jones and C.Wykes, “Holographic and Speckle Interferometry,” Cambridge, UK, (1983). [2] A.J.Moore and J.R.Tyrer, “Phase-stepped ESPI and moiré interf- erometry for measuring the stress-intensity factor and Jintergral,” Exp. Mech., vol.35, pp. 306-314(1995). [3] J.N.Butters and J.A.Leendertz, “A double exposure technique for speckle pattern interferometry,” J.Phys.E, vol 4, pp. 277-279(1971). [4] Burning, D. R. Herriott , J. E. Gallagher , D. P. Rosenfeld , A. D. White and D. J. Brangaccio ,”Digital Wavefront Measuring Interferometry for Testing Optical surfaces and Lenses,” Appl. Opt., vol. 13, pp. 2693(1974). [5] K. Creath ,”Temporal Phase Measurement Methods,” in interfero- gram Analysis ed. D. W. Robinson and G. T. Reid ,Institute of Physics Publishing , pp. 94(1988). [6] Butters, J. N. and Leendertz, J. A. ,”Holographic and Video Techniques Applied to Engineering Measurement,” Journal of Measurement and Control, vol.4, pp. 349-354(1971). [7] P. Hariharan , B. F. Oreb , and T. Eijux ,”Digital phase-shift interferometry:a simple error-compensating phase calculation algorithm,” Appl. Opt., vol. 26, pp. 2504(1987). [8] 張振暉,黃敏睿. “電子斑點干涉術應用於映像管三維位移量測之分析與研究”. 國立中興大學機械工程研究所碩士論文,2000. [9] R. Cusack, J. M. Huntley and H. T. Goldgrein, ”Improved noise immune phase unwrapping algorithm,” Appl. Opt., vol. 34, pp. 781-789(1995). [10] D.C. Ghiglia, M.D. Pritt, “Two-dimensional Phase Unwrapping Theory,” Algorithms and Software, Wiley, New York (1998). [11] J. M. Huntley and H. Huntley, “Temporal phase-unwrapping algorithm for automated interferometry analysis,” Appl. Opt., vol. 32(17), pp. 3047-3052(1993). [12] H. O. Salder and J. M. Huntley, “Temporal phase unwrapping: application to surface profiling of discontinuous objects,” Appl. Opt. vol. 36(13), pp. 2770-2775(1997). [13] W. W. Macy, “Two-dimensional fringe-pattern analysis,” Appl. Opt. vol. 22, pp. 3898-3901(1983). [14] R. M. Goldstein, H. A. Zebker and C. L. Werner, “Satellite radar interferometry : Two-dimensional phase unwrapping,” Radio Science, vol. 23(4), pp. 713-720(1988). [15] N. H. Ching, D. Rosenfeld and M. Braun, “Two-dimensional phase unwrapping using a minimum spanning tree algorithm,” IEEE, vol. 1(3), pp. 355-361(1992). [16] T. J. Flynn, “Two-dimensional phase unwrapping with minimum weighted discontinuity,” J. Opt. Soc. Am. A vol.14(10), pp. 2692-2701(1997). [17] D. C. Ghiglia, G. A. Mastin and L. A. Romero, “Cellular-automata method for phase unwrapping,” J. Opt. Soc. Am. A vol.4, pp. 276-280(1987). [18] M. J. Huang, Zi-Neng He, “Phase unwrapping through zegion-refernced algorithm and window-patching method,” Opt. Comm. vol. 203, pp. 225-241(2002). [19] Physik Instrumente (PI)GmbH&Co.,’’Operating Manual PZ52E:PZT Position Control Modules,’’ Release 2.0,vol.17(1995). [20] Liu-Sheng Wang, K. Jambunathan, Brian N. Dobbins, Shi-Ping He,“Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry.” Optical Engineering, Vol. 35(8), pp. 2333-2340(1996). [21] H. H. Hopkins and H. J. Tiziani ,”Speckling in diffraction patterns and optical images formed with the laser,” Proc. Int. Symp. Hologr. , Besancon ,(1970) . [22] Butters, J. N. and Leendertz, J. A. ,”Holographic and Video Techniques Applied to Engineering Measurement,” Journal of Measurement and Control, vol. 4, pp. 349-354(1971) . [23] K.P. Horn, “Relative Orientation,” International Journal of Computer Vision, vol. 4, pp. 59-78(1990). [24] F. Chen, G.M. Brown and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng.vol. 39(1), pp. 10-22(2000). [25] Pramod K. Rastogi(Ed.),’’shadow moire,’’ Photomechanics, New York: Springer-Verlag, pp. 180-183(1999). [26] D. Post, B. Han, P. Ifju, High Sensitivity Moire′ : Experimental Analysis for Mechanics and Materials. New York: Springer-Verlag, (1994).
摘要: 
由於光學量測方法具有非接觸性及非破壞性,所以很受到工業界的喜愛。本論文的研究方向則是利用非接觸式及非破壞性檢測技術針對形貌不連續相位量測做一系統的探討,如電子斑點干涉術、結構光、疊紋法等。
希望能藉由非接觸式量測技術得到相關的不連續相位圖,加入自動標定原理加強相移術的精確度。
此外在經由本實驗室所提出的相位還原技術將所拍攝的相位圖還原,也能夠因此從相位圖中瞭解不連續的情況。

Mrasurement of optical is a high precision and a nondestructive testing technique , so take the fancy of industrial circle very much. the study a direction is use non-contact and discontinuous to appear outline detect method , such as ESPI , Structured Light , Moire , etc..
It hopes to be can by non-contact mrasurement technology get relevant discontinous phase map , join the automatic standard to improve the accuracy that Phase-shifting method .
In addition is by way of that which to publish phase unwrapping technology of a lab , to be about to take phase map to return to the original shape , can find out about discontinous situation from the phase map too.
URI: http://hdl.handle.net/11455/1816
其他識別: U0005-0908200716043100
Appears in Collections:機械工程學系所

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