Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/2648
標題: 電子斑點干涉術相關相位檢出技術之探討研究及材料表面微裂痕之偵測應用
作者: 楊博仁
關鍵字: ESPI;電子斑點干涉術;ESPSI;phase unwrapping;電子斑點剪像干涉術;相位展開法
出版社: 機械工程學系
摘要: 
本論文針對電子斑點干涉術相關的相位量測技術作一系統性的深入探討與比較,期能整合相關的技術與方法,達到簡便而精確的目標。
藉由相移自動標定技術的使用,結合傳統Creath所提的方法可取得最為乾淨的相位圖,其相位不連續點數(inconsistency)最少,後續的相位展開工作也最為容易。
此外,也成功應用相位展開技術以偵測材料表面的微裂痕。

The phase-extracted techniques of electronic speckle pattern interferometry (ESPI) are reviewed. Systematic analysis and comparison show that Creath's method through the implementation of the auto-marking technique of PZT phase shifter proposed by Huang and Chou in 2000 is recommended for conducting result that exhibits less phase distortion of the wrapped map. Therefore, the subsequent unwrapping jobs are facilitated.
Moreover, applying proper unwrapping algorithm to the map of a deformed object enable the clear detection of surface cracks on a tested sample.
URI: http://hdl.handle.net/11455/2648
Appears in Collections:機械工程學系所

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