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The fourth-axis measuring technique of a five-axis machine tool
|關鍵字:||旋轉誤差;rotary error;位置誤差;幾何精度;貓眼反射鏡;四象限光位置感測器;position error;geometric accuracy;reflector;quadrant photo diode||出版社:||機械工程學系所||引用:|| ISO 230-7 Test code for machine tools-Part 7 “Geometric accuracy of axes of rotation” International Standard, 2006  V. S. B. Kiridena and P. M. Ferreira, “Kinematic Modellng of Quasistatic Errors of Three-Axis Machining Centers”, Int. J. Mach. Tools Manufact, vol. 34, pp. 85-100, 1994.  S. Sakamoto, I. Inasaki, H. Tsukamoto, and T. Ichikizaki, “Identification of alignment errors in five-axis machining centers using telescoping ball bar”, Transactions of the Japan Society of Mechanical Engineers Part C, vol. 63, pp. 262-267, 1997.  Z. A. Ahmad, Y. Kakino, Y. Ihara, and S. Lin, “Analysis of the motion accuracy of 5-axis controlled machining centers using DBB method”, International Conference on Precision Engineering, pp. 55-60, 1997.  Y. Kakino, Y. Ihara, and A. Shinohara, Edited by Dr. Johannes Heidenhan Gmbh,“Accuracy Inspection of NC Machine Tools by Double Ball Bar Methid”, Hanser Gardner Publications  Yi Zhang , Jianguo Yang , Kun Zhang, “Geometric error measurement and compensation for the rotary table of five-axis machine tool with double ballbar”, Original Article, vol. 65 , pp.275-281, 2013.  Y. S. Tarng, J. Y. Kao, Y. S. Lin,1995, “Identification of and compensation for backlash on the contouring accuracy of CNC machining centres ”, Advanced manufacturing technol,1 3, 77-85.  Heui Jae Pahk, Young Sam Kim, Joon Hee Moon, 1997, “A new technique for volumetric error assessment of CNC machine tools incorporating ball bar measurement and 3D volumetric error model”, Pergamon, Vol.37, PP.1583~1596.  W. T. Lei and Y. Y. Hsu, “Accuracy test of five-axis CNC machine tools with 3D probe-ball,part II: errors estimation”, International Journal of Machine Tools & Manufacture, vol. 42 , pp.1163-1170, 2002.  H.L. Liu, H.M. Shi, B. Li, X. Li,2005, “A new method and instrument for measuring circular motion error of NC machine tools”, International journal of machine tools & Manufacture,45 ,1347-1351.  M. Sharif Uddin, Soichi Ibaraki, Atsushi Matsubara, Tetsuya Matsushita,2009, Precision Engineering , 33, 194–201.  Seong-Wook Hong, Young-Jae Shin, Hu-Sang Lee, 1997, “An efficient method for identification of motion error sources from circular test result in NC machines”, Tools manufact, Vol.37, No.3,pp. 327-340.  W. Jywe ,2003, “The development and application of a planar encoder measuring system for performance tests of CNC machine tools”, Advanced manufacturing technology, 21:20-18.  K. Fujino, S. Yamamoto, K. Mitsui, A. Hayashi,2008, “Measuring apparatus for motion accuracy of NC machine tools using links and rotary encoders”, NANO corporation ,223-8522.  Zhengchun Du, Shujie Zhang, Maisheng Hong,2010, “Development of a multi-step measuring method for motion accuracy of NC machine tools based on cross grid encoder”, International Journal of Machine Tools & Manufacture, 50, 270–280.  Cefu Hong , SoichiIbaraki , Chiaki Oyama, “Graphical presentation of error motions of rotary axes on a five-axis machine tool by static R-test with separating the influence of squareness errors of linear axes”, International Journal of Machine Tools & Manufacture, vol. 59 , pp.24-33, 2012.  P. S. Huang, S. Kiyono, Kamada, 1992, “Angle measurement based on the internal-reflection effect: a new method”, APPLIED OPTICS, Vol.31,28.  Suk-Hwan Suh, Eung-Suk Lee, Se-Yong Jung, 1998, “Error Modelling and Measurement for the Rotary Table of Five-axis Machine Tools”, Adv Manuf Technol,14,656-663.  Sung-Ryung Park, Trung-Kien Hoang, Seung-Han Yang,2010, “A new optical measurement system for determining the geometrical errors of rotary axis of a 5-axis miniaturized machine tool”, Journal of Mechanical Science and Technology, 24, 175-179.  A. Balsamo,1995, “Effects of Arbitrary Coefficients of CMM Error Maps on Probe Qualification”, Annals of the CIRP, Vol. 44-1.  Tibet Erkan, J.R. Rene Mayer , Yannick Dupont,2011, “Volumetric distortion assessment of a five-axis machine by probing a 3D reconfigurable uncalibrated master ball artefact”, Precision Engineering, 35, 116-125.  Daniel T. L. Lee, Martin Morf, Benjamin Friedlander, 1981, “Recursive Least Squares Ladder Estimation”, IEEE Transactions on Circuits and system , Vol. CAS-28, No.6.  Mark Berman,1989, “Large Sample Bias in Least Squares Estimators of a Circular Arc Center and Its Radius”, Computer vision, graphics, and image processing , 126-128.  Radim Halii,1998, “Numerically stable direct least squares fitting of ellipses”, The Sixth International Conference in Central Europe on Computer Graphics and Visualization, 21, 125-132.  Sung Joon Ahn, Wolfgang Rauh, Hans-JuK rgen Warnecke, 2001, “Least-squares orthogonal distances "tting of circle, sphere, ellipse, hyperbola, and parabola”, Pattern Recognition, 34, 2283-2303.  劉書華，文良起，瞿建武,2001，“非圓曲線的最小二乘擬合法”，機械加工與自動化,第七期。||摘要:||
本量測系統優點價格低廉，無須使用昂貴的系統零件，架設容易且操作簡單，可有效縮短量測時間並提升效率，整體系統成本低廉，元件尺寸小，且系統量測精度高，其量測系統定位誤差為+/-1.5 um內，解析度可達50 nm。
A procedure is an electro optical measurement rotary accuracy and position accuracy of five-axis machine tools, it is designed to replace the contact type system and light interference measurement system, this system is divided into two parts, first part is rotary axis accuracy measurement system which uses laser diode as system light source and quadrant photo diode to receive light single that can detect the three-dimensional position of cat''s eye reflector . The Second part is cat''s eye reflector which uses ball lens of n=2 with coating aluminum to hemispherical that is used to convey message of the table position on the machine tool. This measurement system will be detected the rotary accuracy and position accuracy of the five-axis machine tools, and use tip tracking for machine tools.
The advantage of this system is low price without expensive optical components, the installation process of it is convenient and quickly, erection of it is sample and reduces the measurement time significantly. This system has low-cost and the components are very small, high measurement accuracy, and position error of system about +/-1.5 μm, system resolution can be measured to 50nm.
|Appears in Collections:||機械工程學系所|
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