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標題: 液晶顯示器線缺陷俢補方法
A Repair Method for Line Defect of TFT LCD
作者: 蔡豐旭
Tsai, Feng-Hsu
關鍵字: 線缺陷;TFT LCD;俢補;Line Defect;Repair Method
出版社: 光電工程研究所
引用: 1. Yun Hee Kwak, Jeong Il Kim,“ Liquid crystal display device repair system and method thereof” Patent US20070040794。 2. Dong QIAN, “ Liquid crystal display device and related repairing methods” Patent US20100188594 3. 顧鴻壽/周本達/陳密/張德安/樊雨心/周宜衡 編著, “平面面板顯示器基本概論”,高立圖書,2005/08. 4. 方木村,“TFT-LCD驅動電路設計技術”,雲林科技大學,碩士論文, 2006/07. 5. 陳世和,“運用電子看板模式提升TFT-LCD良率之研究-以Cell電測站個案為例”,逢甲大學,碩士論文, 2009/07. 6. 邱怡婷, “切割刀輪對液晶顯示器玻璃強度的影響”,元智大學,碩士論文, 2010/07. 7. 陳詠倓, “以黑色矩陣光阻修補液晶顯示器偏光片技術之研究”,台北科技大學,碩士論文, 2009/07. 8. 戴亞祥,“液晶顯示器面板的驅動與設計”,五南出版社, 2008. 9. 楊士明,“液晶顯示器畫面產生抖動閃爍成因探討以及解決方案之研究”,成功大學,碩士論文,2004/07. 10. 簡晨晃,“液晶顯示器畫素修補方法”,中興大學,碩士論文,2010/07. 11. 林思賢,“應用視覺及資料探勘技術於TFT-LCD陣列電路工程線中瑕疵辨識之研究-源/汲電極光罩瑕疵自動分類系統開發”,中原大學,碩士論文,2005/07. 12. 張瑞宏,“電子化學品雜質微粒過濾製程最佳化”,高雄第一科技大學,碩士論文,2008/07. 13. 郭志忠,“TFT-LCD 自動光學檢測-以Cell Zone為基礎之瑕疵分類研究”,成功大學,碩士論文,2008/07. 14. 鄭希龍, “量測系統分析MSA之作法與解析” ,量測資訊,第77期,2000. 15. 台灣光電校正實驗室, “量具之重覆性與再現性討論” ,台儀資訊,第21期,2001 16. 江巧玉, “量測系統重複性與再現性的分析研究” ,成功大學,碩士論文,2002/07 17. Laserfront Technologies, Inc.“LASER REPAIR SL455H3-A #4 Instruction Manual ”,70600847 1st Edition, pp9~19, 2006/11. 18. 網站:



The manufacturing cost of LCD is very high, but the profit margin keeps dipping under the current intense competition. Except improving the success rate, it is also very important to reduce scrap factors. In the process of manufacturing LCD, unavoidably some foreign objects may exist; when assembling LCD, they may cause the upper and the lower electrodes short cut and the line defect, such as a straight line, a sideline, or a cross line, on the LCD panel. The common way to repair it is to cut off the defect portion then use the reserved rescue line to make it up, but often there are limitations, such as other new designs also need extra space. If we can''t repair the defect line, the whole LCD panel becomes scrap and it will reduce the profit margin and competitiveness.
The main purpose of this research is to find the most efficient way to tackle the issue, such as: cutting off the short circuit and repair it on the LCD CF side without affecting or damaging the LCD Array side circuit. Theoretically this approach is a better solution for all common problems for manufacturing LCD panels. To find the ways to reduce scrap factors, this research includes the process of LCD fabrication, monitor driving principle, and the research of laser repairing.
This research uses the Full-factorial experiment method to set up the laser parameters, and then uses software to recognize the images and find out the differences among experiment groups in order to get the optimal solutions. The goal of this research is to find the ways to cut off the CF side ITO completely without damaging the Array side, and finally test the reliability with THB、TCT and TST.
其他識別: U0005-2608201215491400
Appears in Collections:光電工程研究所

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