Please use this identifier to cite or link to this item:
標題: Shapiro steps observed in a superconducting single electron transistor
作者: Liou, S.
Kuo, W.
Suen, Y.W.
Hsieh, W.H.
Wu, C.S.
Chen, C.D.
關鍵字: josephson;behavior
Project: Chinese Journal of Physics
期刊/報告no:: Chinese Journal of Physics, Volume 45, Issue 2, Page(s) 230-236.
The dc current-voltage (IV) characteristics of a superconducting single electron transistor irradiated with microwaves up to 18 GHz are experimentally studied. The switching current as a function of gate voltage demonstrates clear phase-charge duality in a Josephson junction. At higher microwave power levels, Shapiro steps in IV characteristics are observed. The step height in IV can be analyzed using the model an ac-voltage source applied to a single Josephson junction.
ISSN: 0577-9073
Appears in Collections:物理學系所

Show full item record

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.