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|標題:||Ellipse sampling for Monte Carlo applications||作者:||Wang, C.M.
|Project:||Electronics Letters||期刊/報告no：:||Electronics Letters, Volume 40, Issue 1, Page(s) 21-22.||摘要:||
A novel ellipse sampling technique is presented. The technique is efficient, stratified, low distortion and works for both polar and concentric maps between a square and an ellipse. The technique preserves adjacency and fractional area, does not require any numerical computation and has proven to be feasible in Monte Carlo applications.
|Appears in Collections:||資訊科學與工程學系所|
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