Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/37709
標題: Ellipse sampling for Monte Carlo applications
作者: Wang, C.M.
王宗銘 
Hwang, N.C.
Tsai, Y.Y.
Chang, C.H.
Project: Electronics Letters
期刊/報告no:: Electronics Letters, Volume 40, Issue 1, Page(s) 21-22.
摘要: 
A novel ellipse sampling technique is presented. The technique is efficient, stratified, low distortion and works for both polar and concentric maps between a square and an ellipse. The technique preserves adjacency and fractional area, does not require any numerical computation and has proven to be feasible in Monte Carlo applications.
URI: http://hdl.handle.net/11455/37709
ISSN: 0013-5194
DOI: 10.1049/el:20040025
Appears in Collections:資訊科學與工程學系所

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