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|標題:||A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays||作者:||Arora, V.
|關鍵字:||built-in self-diagnosis;embedded memory array testing;march;algorithms;nontraditional memory fault model;serial interfacing;technique;repair||Project:||Ieee Transactions on Instrumentation and Measurement||期刊/報告no：:||Ieee Transactions on Instrumentation and Measurement, Volume 53, Issue 4, Page(s) 915-932.||摘要:||
In this paper, we propose a built-in self-diagnostic march-based algorithm that identifies faulty memory cells based on a recently introduced nontraditional fault model. It is developed based on the DiagRSMarch algorithm, which is a diagnostic algorithm to identify traditional faults for embedded memory arrays. A minimal set of additional operations is added to DiagRSMarch for identifying the nontraditional faults without affecting the diagnostic coverage of the traditional faults. The embedded memory arrays are accessed using a bidirectional serial interfacing architecture which minimizes the routing overhead introduced by the diagnosis hardware. Using the concepts of the bidirectional interfacing technique, parallel testing, and redundant-tolerant operations, the diagnostic process can be accomplished efficiently at-speed with minimal hardware overhead.
|Appears in Collections:||資訊科學與工程學系所|
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