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標題: (IEEE Transactions on CAD,21(4):449-465)A Parallel Built-In Self-Diagnostic Method for Embedded Memory Arrays
作者: D. C. Huang 
W. B. Jone
關鍵字: Built-in self-diagnosis;embedded memory arrays;march operations;memory diagnosis;memory fault model;serial interface technique
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Transactions on CAD, Volume 21, Issue 4, Page(s) 449-465.
Appears in Collections:資訊科學與工程學系所

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