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http://hdl.handle.net/11455/38646| 標題: | (IEEE Transactions on CAD,21(4):449-465)A Parallel Built-In Self-Diagnostic Method for Embedded Memory Arrays | 作者: | D. C. Huang W. B. Jone |
關鍵字: | Built-in self-diagnosis;embedded memory arrays;march operations;memory diagnosis;memory fault model;serial interface technique | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Transactions on CAD, Volume 21, Issue 4, Page(s) 449-465. | URI: | http://hdl.handle.net/11455/38646 |
| Appears in Collections: | 資訊科學與工程學系所 |
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