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標題: (IEEE Transactions on VLSI,10(4):512-515)An Efficient BIST Method for Distributed Small Buffers
作者: W. B. Jone
D. C. Huang 
S. C. Wu
K. J. Lee
關鍵字: Built-in self-testing (BIST);embedded-memory arrays;memory test;serial interface technique;system on chip (SOC) testing
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Transactions on VLSI, Volume 10, Issue 4, Page(s) 512-515.
Appears in Collections:資訊科學與工程學系所

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