Please use this identifier to cite or link to this item:
http://hdl.handle.net/11455/38652
標題: | (IEEE Transactions on VLSI,10(4):512-515)An Efficient BIST Method for Distributed Small Buffers | 作者: | W. B. Jone D. C. Huang S. C. Wu K. J. Lee |
關鍵字: | Built-in self-testing (BIST);embedded-memory arrays;memory test;serial interface technique;system on chip (SOC) testing | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Transactions on VLSI, Volume 10, Issue 4, Page(s) 512-515. | URI: | http://hdl.handle.net/11455/38652 |
Appears in Collections: | 資訊科學與工程學系所 |
Files in This Item:
File | Description | Size | Format | Existing users please Login |
---|---|---|---|---|
download-1.html | 340 B | HTML | This file is only available in the university internal network Request a copy |
TAIR Related Article
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.