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標題: (IEEE Transactions on Instrumentation and Measurement,52(5):1381-1390)An efficient BIST method for non-traditional faults of embedded memory arrays
作者: W. B. Jone
D. C. Huang 
S. R. Das
關鍵字: Embedded Memory Array Test;Bulit-In Self-Testing;Read-Sensitive Faults;Serial Interface Technique;SOC Testing
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Transactions on Instrumentation and Measurement, Volume 52, Issue 5, Page(s) 1381-1390.
Appears in Collections:資訊科學與工程學系所

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