Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/38657
標題: (IEEE Transactions on Instrumentation and Measurement,53(4):915-932)A Parallel Built-In Self-Diagnostic Method for Non-Traditional Faults of Embedded Memory Arrays
作者: V. Arora
W. B. Jone
D. C. Huang 
S. R. Das
關鍵字: Built-In Self-Diagnostic Method;Non-Traditional Faults;Embedded Memory Arrays
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Transactions on Instrumentation and Measurement, Volume 53, Issue 4, Page(s) 915-932.
URI: http://hdl.handle.net/11455/38657
Appears in Collections:資訊科學與工程學系所

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