Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/40987
標題: Nanostructured Ag surface fabricated by femtosecond laser for surface-enhanced Raman scattering
作者: Chang, Han-Wei
Tsai, Yu-Chen
Cheng, Chung-Wei
Lin, Cen-Ying
Lin, Yen-Wen
Wu, Tzong-Ming
關鍵字: SERS;R6G;Ag nanostructure;Femtosecond laser
出版社: Elsevier Inc.
Project: Journal of Colloid and Interface Science, Volume 360, Issue 1, Page(s) 305-308.
摘要: 
Femtosecond laser was employed to fabricate nanostructured Ag surface for surface-enhanced Raman scattering (SERS) application. The prepared nanostructured Ag surface was characterized by field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The FESEM images demonstrate the formation of nanostructure-covered femtosecond laser-induced periodic surface structure, also termed as ripples, on the Ag surface. The AFM images indicate that the surface roughness of the produced nanostructured Ag substrate is larger than the untreated Ag substrate. The XRD and XPS of the nanostructured Ag surface fabricated by femtosecond laser show a face centered cubic phase of metallic Ag and no impurities of Ag oxide species. The application of the produced nanostructured Ag surface in SERS was investigated by using rhodamine 6G (R6G) as a reference chemical. The SERS intensity of R6G in aqueous solution at the prepared nanostructured Ag surface is 15 times greater than that of an untreated Ag substrate. The Raman intensities vary linearly with the concentrations of R6G in the range of 10−8-10−4 M. The present methodology demonstrates that the nanostructured Ag surface fabricated by femtosecond laser is potential for qualification and quantification of low concentration molecules.
URI: http://hdl.handle.net/11455/40987
ISSN: 0021-9797
DOI: 10.1016/j.jcis.2011.04.005
Appears in Collections:化學工程學系所

Show full item record
 

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.