Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/4113
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dc.contributor武東星zh_TW
dc.contributor富振華zh_TW
dc.contributor.advisor洪瑞華zh_TW
dc.contributor.author李逸超zh_TW
dc.contributor.authorLee, Yi-Chauen_US
dc.contributor.other中興大學zh_TW
dc.date2007zh_TW
dc.date.accessioned2014-06-06T06:27:03Z-
dc.date.available2014-06-06T06:27:03Z-
dc.identifierU0005-2608200612071700zh_TW
dc.identifier.citation[1] T. Mukai, H. Narimatsu, and S. Nakamura, Jpn. J. Appl. Phys. 37, 479 (1998). [2] T. Mukai, D. Morita, and S. Nakamura, J. Cryst. Growth 189, 778 (1998). [3] S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 168 (1994). [4] S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys. 34, 1332 (1995). [5] 田運宜, “LED封裝與材料需再突破”, 新電子科技雜誌, 台北, 台灣, (2005). [6] S. Yoshida and S. Gonda, Appl. Phy. Lett. 42, 427 (1983). [7] H. Amano, T. Asahi and I. Akasaki, Jpn. J. Appl. Phys. 29, L205 (1990). [8] H. Amano, M. Kito, K. Hiramatsu, and I. Akasaki, Jpn. J. Appl. Phys. 28, L2112 (1989). [9] S. Nakamura, Jpn. J. Appl. Phys. 30, L1705 (1991). [10]柯煇耀 著, “可靠度保証-工程與管理與技術之應用”, 中華民國品質協會, 台北, 台灣, (2000). [11]張正忠, “產品加速壽命測試規劃之研究-以8025無刷直流風扇為例”, 國立高雄第一科技大學碩士論文, 高雄, 台灣, 10 (2004). [12]A. Elayed, “Reliability Engineering”, Assison Wesley (1996). [13]E. Charles Ebeling, “Reliability and Maintainability Engineering”, McGRAW-Hill, New York. [14]朱一中 , “雙變數加速衰變模型分析(LED產品之個案研究)”, 國立清華大學碩士論文, 新竹, 台灣, 17 (1997). [15]K. Ishikawa, Lu. D. J. trans. , “What is Total Quality Control”, Prentice-Hall Inc., Englewood Cliffs, NJ. (1985). [16]H. C Tseng, W. H. Ip and K. C. Ng , Journal of Engineering and Technology Management Vol 16, 83-101 (1999). [17]許招墉 編著, “光電工學概論”, 全華科技圖書股份有限公司, 台北, 台灣, 132 (1990). [18]施敏 著, 黃調元 譯, “半導體元件物理與製作技術”第二版, 交大出版社, 新竹, 台灣, 86, 99 (2002). [19]丁逸聖, “指叉型氮化鎵發光二極體之設計、製作與量測”, 國立中央大學碩士論文, 桃園, 台灣, 20 (2003). [20]莊達人 編著, “VLSI製造技術”, 高立圖書有限公司, 台北, 台灣, 199~269 (1998). [21]黃裕盛, “MEMS技術於半導體光電元件封裝之研究”, 逢甲大學碩士論文, 台中, 台灣, 12 (2005). [22]江文章, “LED壽命與溫度影響評估報告”, 工研院光電所, 新竹,台灣, (2004). [23]羅文雄等三人譯, “半導體製造技術”, 滄海發行, 臺中, 台灣, 454 (2003). [24]Lumileds, “Luxeon Reliability”, Luxeon Reliability Application Brief AB25, USA 12 (2004). [25]E. FRED SCHUBERT, “Light-Emitting Diodes”, Rensselaer Polytechnic Institute, 132 (2003).zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/4113-
dc.description.abstract產品的可靠度是隨著客戶對產品品質要求而相對的重要,而可靠度指標是藉由產品的失效數據所獲取。然而產品失效數據及及失效模式的取得,就必須由壽命測試來取得其數據與失效樣品。 本論文將藉由氮化鎵發光二極體壽命測試研究影響發光二極體光強度衰減之原因;首先假設影響原因分別為製程、打線、封裝及環境為四大部分,進而改變這些因素來進行亮度壽命測試,藉以驗證出影響發光二極體亮度衰減之原因,以及藉由微觀分析等儀器對失效的試品做進一步的分析與討論。本文之實驗壽命測試時間皆為168小時,觀察其光強度衰減情形,就製程影響原因分為平台跨接N極晶墊及ITO側蝕壽測後分別衰減42及26%;打線影響原因分為打線偏移及打線壓力過大壽測後衰減27及21%;就環境因素來看當發光二極體壽命測試電流增加至30及50mA時,光強度的確提高約212與569mcd,但其壽命卻衰減甚快,分別衰減62%及95%;至於封裝製程,由研究發現環氧樹脂烘烤時間為1~2小時內有最佳的壽命。 因此藉由此次研究探討,期望將影響氮化鎵發光二極體壽命之因素集中在製程、打線、封裝及環境之變因下建立相關的分析資料,並加以驗證討論而建立分析模型,以作為後續對影響發光二極體亮度之失效模式分析的基礎,且作為發光二極體製程最佳化之參考,提升產品的可靠度。zh_TW
dc.description.abstractThe importance of reliability of product increases because of demands from customers, and reliability index is obtained by failure analysis (FA) data. However, FA data and FA mode comes from testing data of reliability test and FA samples. This thesis is trying to explore all the causes reason of LED intensity decay by means of reliability test. It is categorized by chip process、wire bonding、package and environment are four factors. We will modify those factors in reliability test and do further test and analysis bases on LED intensity decay reasons, also using microcosmic analysis equipments to test FA sample. In our experiment we set the testing time to be 168hr and observe LED intensity decay status. The process factor divides into the platform bridge N-pad and the ITO side etching, after experiment decays 42% and 26% respectively; The electric factor divides into bonding shift and huge of bonding pressure, after experiment decays 27.42% and 21.32%;In the environment factor when the electric current increases to 30 and 50mA, the LED intensity indeed enhances approximately 212 and 569mcd, but its lifespan actually decay quickly, decays 62.35% and 95.67%; by the research discovered Epoxy bakes the time is in the 1~2 hour has the best lifespan in process factor. From this report, we wish that factors effecting LED life can be controlled by process, wire bonding, package and environment and build up analysis module as good reference for further analysis of LED intensity in FA mode in order to improve product reliability.zh_TW
dc.description.tableofcontents目錄 封面內頁 審核頁...................................................i 授權頁..................................................ii 致謝...................................................iii 中文摘要................................................iv Abstract.................................................v 目錄....................................................vi 圖目錄..................................................ix 第一章 緒論.............................................1 1-1 前言.................................................1 1-2 氮化鎵元件發展歷史...................................2 1-3 未來發展.............................................4 1-4 研究動機.............................................5 1-5 論文架構.............................................5 第二章 壽命測試之重要性..................................6 2-1 可靠度相關理論.......................................6 2-1-1 可靠度定義.........................................7 2-2 加速壽命測試.........................................9 2-2-1 加速壽命測試之意義與所需假設.......................9 2-2-2 加速壽命測試的類型................................10 2-2-3 加速因子..........................................12 2-3 產品壽命試驗數據分析................................12 2-3-1 產品失效數據取得方法..............................12 2-4 魚骨圖法............................................14 2-4-1魚骨圖之定義與繪製.................................14 2-4-2 繪製魚骨圖目的....................................15 2-5 封裝廠商壽命測試標準................................15 第三章 發光二極體原理及壽測元件之製作...................17 3-1 前言................................................17 3-2 發光二極體光電特性..................................17 3-3 氮化鎵發光二極體元件製作............................19 3-3-1 氮化鎵試片之磊晶結構..............................20 3-3-2 試片清洗..........................................20 3-3-3 MESA(平台)蝕刻..................................21 3-3-4 側壁保護..........................................21 3-3-5 透明導電層及歐姆接觸..............................22 3-3-6 電極之製作........................................23 3-4 壽測元件之準備......................................24 3-4-1元件切割、打線與封裝...............................24 3-4-2 壽命測試模型之建立................................25 3-4-3 De-cap介紹........................................26 3-5 壽命測試類型與失效數據取得方法......................27 3-6 壽命測試實驗目的....................................28 3-7 實驗安排與規劃......................................28 3-8 實驗設備及儀器......................................29 第四章 實驗結果與討論...................................30 4-1 前言................................................30 4-2 影響發光二極體亮度壽測之探討........................30 4-2-1 壽命測試之失效模式討論與假設......................30 4-2-2 魚骨圖............................................30 4-3 製程因素影響之探討.................................31 4-3-1 MESA平台跨接至N極晶墊.............................31 4-3-2 透明導電層ITO側蝕.................................33 4-4 打線因素影響之探討..................................35 4-4-1 打線偏移..........................................35 4-4-2 打線壓力過大......................................36 4-5 封裝因素影響之探討..................................38 4-5-1 銀膠與水膠之散熱探討..............................38 4-5-2 環氧樹脂烘烤時間之長短............................40 4-6 環境因素影響之探討..................................41 4-6-1 提高壽測電流......................................41 第五章 結論.............................................44 參考文獻................................................46zh_TW
dc.language.isoen_USzh_TW
dc.publisher精密工程學系所zh_TW
dc.relation.urihttp://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-2608200612071700en_US
dc.subjectGaNen_US
dc.subject氮化鎵zh_TW
dc.subjectlife testen_US
dc.subjectreliabilityen_US
dc.subjectLED intensity decayen_US
dc.subject壽命測試zh_TW
dc.subject可靠度zh_TW
dc.subjectLED亮度衰減zh_TW
dc.title氮化鎵發光二極體壽命測試之研究zh_TW
dc.titleInvestigation of Reliability Test on GaN Light-Emitting Diodesen_US
dc.typeThesis and Dissertationzh_TW
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeThesis and Dissertation-
item.cerifentitytypePublications-
item.fulltextno fulltext-
item.languageiso639-1en_US-
item.grantfulltextnone-
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