Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/4127
DC FieldValueLanguage
dc.contributor陳偉立zh_TW
dc.contributorWei-Li Chenen_US
dc.contributor.advisor孫允武zh_TW
dc.contributor.advisorYuen-Wuu Suenen_US
dc.contributor.author鄭善允zh_TW
dc.contributor.authorCheng, Shan-Yunen_US
dc.contributor.other中興大學zh_TW
dc.date2009zh_TW
dc.date.accessioned2014-06-06T06:27:04Z-
dc.date.available2014-06-06T06:27:04Z-
dc.identifierU0005-0102200816365400zh_TW
dc.identifier.citationReferences: [1] X. Zhang, S. J. Chua, P. Li, K. B. Chong, and W. Wang, Appl. Phys. Lett. 73, 1772 (1998). [2] H. Amano, M. Iwaya, T. Kashima, M. Katsuragawa, I. Akasaki, J. Han, S. Hearne, J. A. Floro, E. Chason, and J. Figiel , Jpn. J. Appl. Phys. 37, L1540 (1998). [3] K. Hiromatsu, S. Itoh, H. Amano, I. Akasaki, N. Kuwano, T.Shiraishi ,and K. Oki, J. Cryst. Growth 115, 628 (1991). [4] L. Sugiura, J. Appl. Phys. 81, 1633 (1996). [5] V. Narayanan, K. Lorenz, W. Kim ,and S. Mahajan,Appl. Phys. Lett. 78, 1544(2001). [6]李世昌博士論文,”GaNAs材料磊晶成長與AlAs濕氧化模之研究”,交通 大學電子物理系, 2000. [7] S. M. Sze, ”Semiconductor Devices Physics and Technology” ,2nd Edition,Wiley,USA, 2002. [8] J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80,3967 (2002). [9] R. R. King, D. C. Law, C. M. Fetzer, R. A. Sherif, K. M. Edmondson, S. Kurtz, G. S. Kinsey, H. L. Cotal, D. D. Krut, J. H. Ermer, and N. H. Karam, Proceddings of the 20th European Photovoltaic Solar Engery Conference Barcelona, Spain, p.118(2005). [10] O. Jani, I. Ferguson, C. Honsberg, and S. Kurtz, Appl. Phys. Lett. 91, 132117(2007). [11] A.V. Derizel, ”Noise Source Characterization Measurement”, Prentice-Hall, New Jersey, 1970. [12] A. B. Carlson, ”Communication System an introduction to signal and Noise In Electrical Communcation”,2nd Edition, New York. [13] J. B. Johnson, Phys. Rev. 32, 97 (1928). [14] H. Nyquist, Phys. Rev. 32, 110 (1928). [15] B. E. A. Saleh,”Fundamentals of Photonics ”,Wiley Interscience, 1991. [16] P. Dutta and P. M. Horn , Rev. Mod. Phys. 53, 497 (1981). [17] J. R. Gong, S. F. Tseng, C. W. Hung, Y. L. Tsai, W. T. Liao, C. L. Wang, B. H. Shi ,and T. Y. Lin, Jpn. J. Appl. Phys. 42 (2003). [18] C. L. Wang, J. R. Gong, M. F. Yeh, B. J. Wu, W. T. Liao, T.Y. Lin, and C. K. Lin, I.E.E.E. Photon. Lett. Technol. 18, 14 (2006). [19] J. Wu, W. Walukiewicz, K.M. Yu, J. W. Ager III, E. E. Haller, H. Lu and W. J. Schaff, Appl. Phys. Lett. 80, 4741(2002). [20] C. Kittel,”Introduction to Solid State Physics”,7th Eition,Wiley,USA, 1996. [21] W. F. Smith,” Foundation of Materials Science and Engineering”,3rd Edition,McGrawHill,USA, 2004 [22]郭正次,”材料分析”,Chapter10,中國材料科學學會,ROC,1998. [23] A. C. Young, J. D. Zimmerman, E. R. Brown, and A. C. Gossard, J. Appl. Phys. 101,084509 (2007). [24] D. A. Neamen,”Electronic Circuit Analysis and and Design”,Irwin, 1996. [25] S. L. Rumyantsev, M. S. Shur, Yu. Bilenko, P. V. Kosterin, and B. M. Salzberg, J. Appl. Phys. 96, 2 (2004). [26] Stanford Research Systems Inc, Model SR560 Low-Noise Voltage Preamplifer,1290-D Reamwood Avenue, Sunnyvale, CA 94089, U.S.A., 1995. [27] Stanford Research Systems Inc, Model SR780 Network Signal Analyzer, 1290-D Reamwood Avenue, Sunnyvale, CA 94089, U.S.A., 1995. [28] S. D. Stearns,”Digital Signal Processing with Examples in Matlab”,CRC Press LLC, 2003. [29] S. W. Smith,”Digital Signal Processing”,Newnes, 2003. [30] D. Hull,”Introduction to dislocation”,3rd Edition, Robert Maxwell, UK, 1983.zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/4127-
dc.description.abstract摘要 近年來,因為開發新能源的趨勢,所以太陽能電池和發光二極體成了熱門的研究,太陽能電池是開發新能源,發光二極體是節省能源,光電元件因為其結構微小,其雜訊的大小,也是研究的一大課題。 本論文是研究短週期超晶格緩衝層對GaN/InGaN P-N接面低頻雜訊光電壓的影響。樣品共分三種,分別是做一個短週期超晶格為緩衝層,兩個短週期超晶格緩衝層,三個短週期超晶格緩衝層的P-N接面。在加順向偏壓時,兩個超晶格緩衝層樣品有最大的電流(4V下85mA),在相同的電壓下,發光效率也以兩個超晶格緩衝層樣品最好,而三個超晶格緩衝層樣品因為應力釋放,其缺陷密度反而比兩個超晶格緩衝層和一個超晶格緩衝層樣品高。我們對這些樣品做照光電壓不同的雜訊量測,判斷其雜訊的形式和其照光電壓對雜訊大小之影響,也判斷是否和其缺陷密度大小有關,根據實驗所得的數據可以知道,以含有一個超晶格緩衝層所量得的雜訊最小,兩個超晶格緩衝層樣品次之,三個超晶格緩衝層樣品雜訊最大,和其差排密度大小並不完全吻合,只能說雜訊大者,其差排密度有可能是比較大的,而其雜訊形式均是以1/f為主。zh_TW
dc.description.abstractAbstract In recent years, the trend of developing new energy resources, solar cell and light emitting diode becomes a popular area in research. The solar cell gives a new source of energy, the light emitting diode saves energy for lighting and many other photonic devices provide variety of service for our daily life. The noise behavior of these systems devices is a very important topic while being applied to real systems. This thesis is about the effect of short-period superlattice (SPSL) in GaN/InGaN P-N junction structures on noise of photo voltage. We used three kinds of samples in this study: samples with a SPSL layer, samples with two buffer layers, and samples with three SPSL layers. Under same forward bias voltage, samples with two buffer layers has the largest current(85mA at 4V) and also luminescence efficiency.Samples with three buffer layers has a larger defect density than that of other samples due to the strain relaxation problem. We measured the noise spectrum of these samples under different photo-voltage bias. The photovoltage of these samples shows an enhanced 1/f noise, whose magnitude increases with the power of illumination. According to our experiment data,the samples with one buffer layer has the lowest noise, while samples with two buffer layers has the second lowest noise and samples with three buffer layers has the highest noise. Even though the defects density and noise behavior do not match completely, our results do suggest that higher dislocation density causes higher noise level.en_US
dc.description.tableofcontentsChapter 1 簡介 1.1研究動機---------------------------------------------------------------------1 1.2降低TD的方法------------------------------------------------------------- 3 Chapter 2 光伏打效應的量測和原理 2.1標準光源--------------------------------------------------------------------- 5 2.2光伏打效應原理------------------------------------------------------------ 7 2.3光的吸收---------------------------------------------------------------------10 Chapter 3 雜訊簡介 3.1雜訊形式---------------------------------------------------------------------11 3.2 Power Spectral Density ----------------------------------------------------13 3.3 thermal Noise 和 shot Noise--------------------------------------------- 14 3.4 1/f Noise 和 Lorentzian Noise ------------------------------------------- 16 Chapter 4 實驗設計和量測 4.1樣品結構---------------------------------------------------------------------18 4.2 實驗設計-------------------------------------------------------------------- 4.3計算兩個緩衝層樣品理想因子(ideal factor)--------------------------- 22 23 4.4光伏打效應量測------------------------------------------------------------ 26 4.5量測的儀器和實驗裝置圖----------------------------------------------- 28 Chapter 5 量測結果與討論 5.1數據與分析討論------------------------------------------------------------ 30 5.2 結果與分析比較----------------------------------------------------------- 5.3以-200 MΩ loading光壓曲線與34401A電表量測值比較--------- 38 42 Chapter 6 結論 44 references------------------------------------------------------------------------------------ 46 附錄一--------------------------------------------------------------------------------------- 49 附錄二--------------------------------------------------------------------------------------- 59 附錄三--------------------------------------------------------------------------------------- 64 附錄四--------------------------------------------------------------------------------------- 68 附錄五Burgers vector和Burger circuit簡介------------------------------------------ 70zh_TW
dc.language.isoen_USzh_TW
dc.publisher精密工程學系所zh_TW
dc.relation.urihttp://www.airitilibrary.com/Publication/alDetailedMesh1?DocID=U0005-0102200816365400en_US
dc.subjectshort-period superlatticeen_US
dc.subject短週期超晶格zh_TW
dc.subjectnoiseen_US
dc.subject雜訊zh_TW
dc.title短週期超晶格緩衝層對GaN/InGaN P-N接面 光電壓低頻雜訊之影響zh_TW
dc.titleEffects of short-period superlattice buffer on the low-frequency noise of photovoltage for GaN/InGaN P-N junctionsen_US
dc.typeThesis and Dissertationzh_TW
item.fulltextno fulltext-
item.languageiso639-1en_US-
item.openairetypeThesis and Dissertation-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
Appears in Collections:精密工程研究所
Show simple item record
 

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.