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標題: How knowledge map fit and personalization affect success of KMS in high-tech firms
作者: Lai, J.Y.
Wang, C.T.
Chou, C.Y.
關鍵字: Effectiveness;IS success;Knowledge management systems (KMS);Knowledge;map fit;Personalization;User satisfaction;information-systems;user satisfaction;management-systems;model;technology;creation;validation;acceptance;business;barriers
Project: Technovation
期刊/報告no:: Technovation, Volume 29, Issue 4, Page(s) 313-324.
The shift from it product-based to a knowledge-based economy has resulted in all increasing demand for organizations to implement knowledge management systems (KMS) at in accelerating pace. However, factors influencing success of KMS have seldom been empirically examined by prior research, particularly how knowledge map fit and personalization influence employee satisfaction with KMS, which is it surrogate measure of the success/effectiveness of information systems (IS). Results from a sample of 133 employees, mostly from four international high-tech companies in the Hsin-Chu Science-based Industrial Park in Taiwan, help us better understand what factors affect employee satisfaction with KMS. The result shows that KMS with a higher level of knowledge map fit and personalization will satisfy employees directly or indirectly through the mediation effects of increased perceptions of case of use and usefulness of KMS. Our findings could serve as useful references for researchers and practitioners interested in investigating issues related to the successful implementation of KMS. (C) 2008 Elsevier Ltd. All rights reserved.
ISSN: 0166-4972
DOI: 10.1016/j.technovation.2008.10.007
Appears in Collections:科技管理研究所

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