Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43494
標題: X-ray photoelectron spectroscopy and magnetic force microscopy studies of ion-beam deposited Ni80Fe20/Co-oxide bilayers
作者: Lin, K.W.
林克偉
Lin, F.T.
Tzeng, Y.M.
關鍵字: exchange coupling;ion-beam deposition technique;NiFe/Co-oxide bilayers;exchange;model
Project: Ieee Transactions on Magnetics
期刊/報告no:: Ieee Transactions on Magnetics, Volume 41, Issue 2, Page(s) 927-929.
摘要: 
The correlation between the structural and magnetic properties in Ni80Fe20/Co-oxide bilayers that were prepared using a dual-ion beam deposition technique has been investigated. The pure Permalloy (M80Fe20) film (a = 3.53 Angstrom) consisted of face-centered cubic nanocrystallites. Films prepared with 8% O-2 and 34% O-2 in the assist beam consisted of rock-salt CoO (a = 4.27 Angstrom) and spinel CO3 O-4 (a = 8.21 Angstrom). The composition and oxidation state of the Co-oxide layers were analyzed with X-ray photoelectron spectroscopy (XPS), X-ray diffractometry (XRD), and transmission electron microscopy (TEM). Magnetic force microscopy (MFM) revealed that the Ni80Fe20/Co bilayer exhibited ripple domains, whereas cross-tie domain walls were found in Ni80Fe20/CoO bilayer. At 289 K, the pure Permalloy film exhibited soft magnetic properties while a magnetic hardening with enhanced coercivity was observed in the Ni80Fe20/CoO bilayer. Additionally, the Ni80Fe20/CoO bilayer exhibited an exchange shift H-ex similar to -75 Oe at 150 K.
URI: http://hdl.handle.net/11455/43494
ISSN: 0018-9464
DOI: 10.1109/tmag.2004.842125
Appears in Collections:材料科學與工程學系

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