Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43497
DC FieldValueLanguage
dc.contributor.authorLin, K.W.en_US
dc.contributor.author林克偉zh_TW
dc.contributor.authorGuo, J.Y.en_US
dc.contributor.authorLiu, H.Y.en_US
dc.contributor.authorOuyang, H.en_US
dc.contributor.authorChan, Y.L.en_US
dc.contributor.authorWei, D.H.en_US
dc.contributor.authorvan Lierop, J.en_US
dc.date2008zh_TW
dc.date.accessioned2014-06-06T08:10:57Z-
dc.date.available2014-06-06T08:10:57Z-
dc.identifier.issn0021-8979zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/43497-
dc.description.abstractThe structural and magnetic properties of NiCo/(Ni,Co)O bilayers were investigated. X-ray diffractometry results have shown that the top NiCo layer consisted of a fcc NiCo phase. The bilayer bottom was either a pure (Ni,Co)O or a composite [NiCo+(Ni,Co)O] phase, depending on the percent of O(2)/Ar ratio used during deposition. A double-shifted hysteresis loop exhibiting components that were from positive or negative coupling was observed in the NiCo/(Ni,Co)O (8%O(2)/Ar) bilayers. The microstructural changes, which result from a combination of deposition oxygen content and the ion-beam bombardment, will result in the unusual exchange bias behavior. (c) 2008 American Institute of Physics.en_US
dc.language.isoen_USzh_TW
dc.relationJournal of Applied Physicsen_US
dc.relation.ispartofseriesJournal of Applied Physics, Volume 103, Issue 7.en_US
dc.relation.urihttp://dx.doi.org/10.1063/1.2837502en_US
dc.subjectirradiationen_US
dc.subjectfef2-feen_US
dc.titleAnomalous exchange bias behavior in ion-beam bombarded NiCo/(Ni,Co)O bilayersen_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1063/1.2837502zh_TW
item.languageiso639-1en_US-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairetypeJournal Article-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextno fulltext-
Appears in Collections:材料科學與工程學系
Show simple item record
 

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.