Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43510
標題: Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film
作者: Ouyang, H.
林克偉
Lin, K.W.
Liu, C.C.
Lo, S.C.
Tzeng, Y.M.
Guo, Z.Y.
van Lierop, J.
關鍵字: bilayers;anisotropy;model
Project: Physical Review Letters
期刊/報告no:: Physical Review Letters, Volume 98, Issue 9.
摘要: 
A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.
URI: http://hdl.handle.net/11455/43510
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.98.097204
Appears in Collections:材料科學與工程學系

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