Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/43510
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dc.contributor.authorOuyang, H.en_US
dc.contributor.author林克偉zh_TW
dc.contributor.authorLin, K.W.en_US
dc.contributor.authorLiu, C.C.en_US
dc.contributor.authorLo, S.C.en_US
dc.contributor.authorTzeng, Y.M.en_US
dc.contributor.authorGuo, Z.Y.en_US
dc.contributor.authorvan Lierop, J.en_US
dc.date2007zh_TW
dc.date.accessioned2014-06-06T08:10:59Z-
dc.date.available2014-06-06T08:10:59Z-
dc.identifier.issn0031-9007zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/43510-
dc.description.abstractA Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.en_US
dc.language.isoen_USzh_TW
dc.relationPhysical Review Lettersen_US
dc.relation.ispartofseriesPhysical Review Letters, Volume 98, Issue 9.en_US
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevLett.98.097204en_US
dc.subjectbilayersen_US
dc.subjectanisotropyen_US
dc.subjectmodelen_US
dc.titleExchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin filmen_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1103/PhysRevLett.98.097204zh_TW
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en_US-
item.openairetypeJournal Article-
item.grantfulltextnone-
item.fulltextno fulltext-
item.cerifentitytypePublications-
Appears in Collections:材料科學與工程學系
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