Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/44224
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dc.contributor.authorH.Y.Chenen_US
dc.contributor.authorJ.H.Chenen_US
dc.contributor.authorF.H.Luen_US
dc.contributor.other國立中興大學材料科學與工程學系zh_TW
dc.date2007zh_TW
dc.date.accessioned2014-06-06T08:12:02Z-
dc.date.available2014-06-06T08:12:02Z-
dc.identifier.urihttp://hdl.handle.net/11455/44224-
dc.language.isoen_USzh_TW
dc.publisherNetherlands:Elsevieren_US
dc.relationThin Solid Films, Volume 516, Issue 2-4, Page(s) 345-348.en_US
dc.subjectX-ray diffractionen_US
dc.subjectNitridesen_US
dc.subjectTiAlNen_US
dc.subjectElastic propertiesen_US
dc.subjectPoisson's ratioen_US
dc.subjectYoung's modulusen_US
dc.title(Thin Solid Films,516(2-4):345-348)Evaluation of Poisson's ratio and Young's modulus of nitride films by combining X-ray diffraction and laser curvature techniquesen_US
item.languageiso639-1en_US-
item.grantfulltextnone-
item.fulltextno fulltext-
Appears in Collections:材料科學與工程學系
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