Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/44237
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dc.contributor.authorH.Y.Chenen_US
dc.contributor.authorF.H.Luen_US
dc.contributor.other國立中興大學材料科學與工程學系zh_TW
dc.date2006zh_TW
dc.date.accessioned2014-06-06T08:12:03Z-
dc.date.available2014-06-06T08:12:03Z-
dc.identifier.urihttp://hdl.handle.net/11455/44237-
dc.language.isoen_USzh_TW
dc.publisherNetherlands:Elsevieren_US
dc.relationThin Solid Films, Volume 515, Issue 4, Page(s) 2179-2184.en_US
dc.subjectOxidationen_US
dc.subjectNitridesen_US
dc.subjectX-ray diffractionen_US
dc.subjectScanning electron microscopyen_US
dc.title(Thin Solid Films,515(4):2179-2184)Oxidation behavior of chromium nitride filmsen_US
item.fulltextno fulltext-
item.languageiso639-1en_US-
item.grantfulltextnone-
Appears in Collections:材料科學與工程學系
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