Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/44879
標題: Spatially resolved, laser-induced breakdown spectroscopy, development, and application for the analysis of Al and Si in nickel-based alloys
作者: Tsai, S.J.J.
曾柏昌
Chen, S.Y.
Chung, Y.S.
Tseng, P.C.
關鍵字: induced plasma spectroscopy;quantitative-analysis;aluminum-alloys;steel samples;microanalysis;pulses;nanosecond;parameters;ablation;elements
Project: Analytical Chemistry
期刊/報告no:: Analytical Chemistry, Volume 78, Issue 21, Page(s) 7432-7439.
摘要: 
Spatially resolved laser-induced breakdown spectroscopy (SRLIBS) was used for the characterization of aluminum and silicon in nickel-based alloys. The very low invasiveness of the technique was one of the figures of merit of LIBS; however, the relative complexity of the instrument often hindered the widely acceptance of LIBS. Spatially resolved LIBS could provide accuracy and precision comparable to those obtained with temporally resolved LIBS (TRLIBS). In the nongated spatially resolved LIBS, the maximum atomic emission could be obtained with relative low continuum background emission at optimum observation spatial position. The study was done with a Nd:YAG laser at 532 nm, 3.0 mJ laser energy, and 0.2 mbar in argon. The experimental results obtained under optimum conditions were compared to those obtained with TRLIBS. SRLIBS gave reliable results without the tedious optimization of the delay time and gate width.
URI: http://hdl.handle.net/11455/44879
ISSN: 0003-2700
DOI: 10.1021/ac060749d
Appears in Collections:機械工程學系所

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