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|標題:||An approach to fabricating microstructures that incorporate circuits using a post-CMOS process||作者:||Dai, C.L.
|關鍵字:||aspect-ratio microstructures;optical modulator;technology;sensor;gyroscope||Project:||Journal of Micromechanics and Microengineering||期刊/報告no：:||Journal of Micromechanics and Microengineering, Volume 15, Issue 1, Page(s) 98-103.||摘要:||
This study proposes a method of fabricating microstructures that incorporate circuits using a standard CMOS (complementary metal oxide semiconductor) process and a post-process. The post-process has two main steps. One uses a photoresist (PR) mask to protect the bonding pads, the circuits and the unneeded etched regions in the chip. The other step employs CF4/O-2 RIE (reactive ion etching) and SF6/O-2 RIE to etch the sacrificial layers to release the suspended microstructures. A 5.8 GHz low-noise amplifier (LNA) was employed to verify whether the post-process affects the performance of the circuits or not. The test results indicated that the performance of the LNA was the same before and after the post-process, proving that the post-process did not change the functionality of the circuits. Hence, the advantage of the post-process is that it does not damage the bonding pads, the passivation layers and the circuits, which are protected by the PR mask.
|Appears in Collections:||機械工程學系所|
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