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|標題:||Analysis of particle-wall interactions during particle free fall||作者:||Chein, R.Y.
|關鍵字:||colloidal force;electrical double layer;equilibrium distance;Brownian;jump;particle deposition;brownian particles;parallel-plate;impinging jet;flow chamber;dlvo;theory;deposition;polystyrene;collectors;barriers;kinetics||Project:||Journal of Colloid and Interface Science||期刊/報告no：:||Journal of Colloid and Interface Science, Volume 288, Issue 1, Page(s) 104-113.||摘要:||
In this study, the vertical motion of a particle in a quiescent fluid falling toward a horizontal plane wall is analyzed, based on simplified models. Using the distance between the particle and wall as a parameter, the effects of various forces acting on the particle and the particle motion are examined. Without the colloidal and Brownian forces being included, the velocity of small particles is found to be approximately equal to the inverse of the drag force correction function used in this study as the particle approaches the near-wall region. Colloidal force is added to the particle equation of motion as the particle moves a distance comparable to its size. It is found that the particle might become suspended above or deposited onto the wall, depending on the Hamaker constant, the surface potentials of the particle and wall, and the thickness of the electrical double layer (EDL). For strong EDL repulsive force and weaker van der Waals (VDW) attractive force, the particle will become suspended above the wall at a distance at which the particle velocity is zero. This location is referred to as the equilibrium distance. The equilibrium distance is found to increase with increased in EDL thickness when a repulsive force barrier appears in the colloidal force interaction. For the weak EDL repulsive force and strong VDW attractive force case, the particle can become deposited onto the wall without the Brownian motion effect. The Brownian jump length was found to be very small. Many Brownian jumps would be required in a direction toward the wall for a suspended particle to become deposited. (c) 2005 Elsevier Inc. All rights reserved.
|Appears in Collections:||機械工程學系所|
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