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|標題:||A novel contact resistance model of anisotropic conductive film for FPD packaging||作者:||Wang, G.J.
|Project:||Microsystem Technologies-Micro-and Nanosystems-Information Storage and Processing Systems||期刊/報告no：:||Microsystem Technologies-Micro-and Nanosystems-Information Storage and Processing Systems, Volume 13, Issue 11-12, Page(s) 1477-1482.||摘要:||
A novel contact resistance model for the flat panel display (FPD) packaging based on the within layer parallel and between layers series resistance concepts is proposed in this research. The FJ2530 anisotropic conductive films (ACF) by Sony Inc., containing the currently smallest 3 mu m conductive particles, was used to conduct experiments to verify the accuracy of the proposed model. The calculated chip-on-glass (COG) packaging resistance using the proposed model is 0.165 Omega. It is found that a gold bump with 0.162 Omega resistance play a major role in the overall resistance. Although the predicted resistance using the proposed model is only one third of the experimentally measured value a threefold improvement is obtained compared to existing models.
|Appears in Collections:||生醫工程研究所|
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