Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/51298
標題: 超大型積體電路之整體測試資料產生
Integrated Test Generation for VLSI Circuit
作者: 王行健
關鍵字: 基礎研究;電子電機工程類, 資訊科學--軟體
URI: http://hdl.handle.net/11455/51298
其他識別: NSC83-0404-E005-010
Appears in Collections:資訊科學與工程學系所

Show full item record
 

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.